| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
Comet America |
F INPUT MODULE FOR DATALOGGER MS |
20 |
|
 |
Comet America |
SENSOR HOLDER FOR RACK 19" |
20 |
|
 |
Comet America |
OG INPUT MODULE FOR LOGGER MS |
20 |
|
 |
Comet America |
FG INPUT MODULE FOR LOGGER MS |
20 |
|
 |
Comet America |
WATERTIGHT CASE W/ WALL HOLDERS |
20 |
|
 |
Comet America |
WALL HOLDER FOR THE MULTILOGGER |
20 |
|
 |
Comet America |
THERMOPAPER FOR GXXXX |
20 |
|
 |
Comet America |
TOOL WAGO 236 FOR ANALOG OUTPUT |
20 |
|
 |
Comet America |
OUTPUT RELAYS MODULE |
20 |
|
 |
Comet America |
CTK COUNTER LOGGER MS |
20 |
|
Test and Measurement Accessories (TMA) are peripheral devices used to enhance the functionality, accuracy, and safety of measurement systems. These components enable signal transmission, environmental adaptation, and physical interfacing between test equipment and devices under test (DUT). Their importance in modern technology spans across R&D, quality control, and field diagnostics, ensuring reliable data acquisition in electronics, telecommunications, and industrial systems.
| Type | Functional Characteristics | Application Examples |
|---|---|---|
| Probes | Signal acquisition with high impedance and bandwidth | Oscilloscope probes for circuit debugging |
| Sensors | Convert physical quantities to electrical signals | Temperature sensors in environmental monitoring |
| Cables and Adapters | Ensure low-loss signal transmission | RF cables for 5G network testing |
| Load Banks | Simulate electrical loads for system validation | Power supply stress testing in data centers |
| Optical Attenuators | Control light signal strength in fiber optics | Telecom network signal balancing |
Typical TMA configurations include: - Probe assemblies: Tip contact points, coaxial shielding, and connector interfaces (e.g., SMA, BNC) - Sensor modules: Sensing elements (e.g., thermocouples, strain gauges), signal conditioning circuits, and protective housings - Interconnect systems: Multi-layer dielectric materials with impedance-controlled conductors - Calibration hardware: Precision resistors, reference voltage sources, and traceable measurement standards
| Parameter | Description | Importance |
|---|---|---|
| Frequency Range | Operational bandwidth (DC-40GHz) | Determines signal fidelity for high-speed measurements |
| Accuracy Class | Measurement error tolerance ( 0.01% to 1%) | Critical for compliance testing in medical devices |
| Impedance Matching | 50 /75 standardization | Minimizes signal reflection in RF systems |
| Environmental Rating | IP67, temperature range (-40 C to +150 C) | Ensures reliability in harsh industrial conditions |
| Dynamic Range | Signal amplitude capability (e.g., -100dBm to +30dBm) | Essential for wireless communication testing |
Major industries include: - Electronics manufacturing: PCB testing with flying probe testers - Telecommunications: 5G base station RF analysis - Medical devices: ECG machine calibration - Energy systems: Solar inverter efficiency monitoring - Automotive: CAN bus signal integrity verification
| Manufacturer | Representative Product | Key Features |
|---|---|---|
| Keysight Technologies | N2890A Differential Probe | 1GHz bandwidth, 100:1 attenuation ratio |
| Tektronix | P5200A High-Voltage Probe | 200MHz, 1000V measurement capability |
| Fluke Calibration | 729 Pressure Controller | Automatic pressure control with 0.01% accuracy |
| Rohde & Schwarz | SMA100B Signal Source | 10MHz-44GHz frequency range for lab use |
Key considerations: - Compatibility: Match connector types and impedance with test equipment - Environmental factors: Consider temperature, humidity, and vibration resistance - Measurement resolution: Select accuracy class based on application standards (e.g., ISO 17025) - Cost-efficiency: Balance precision requirements with budget constraints - Calibration support: Verify availability of NIST/ISO traceable certification
Emerging developments: - Smart accessories: Integrated IoT-enabled probes with real-time data logging - High-frequency solutions: Development for 6G testing beyond 100GHz - Miniaturization: Chip-scale sensors for embedded system testing - Software integration: API-enabled accessories for automated test systems - Energy efficiency: Low-power consumption designs for portable field instruments