Monitors, Testers

Image Part Number Description / PDF Quantity Rfq
SRMETER2

SRMETER2

SCS

SURFACE RESISTANCE METER CERT

2

770734

770734

SCS

VERIFICATION TESTER, FOR 724 PLU

56

770768

770768

SCS

GLOVE CONSTANT AREA AND FORCE EL

1

718

718

SCS

STATIC SENSOR FIELD METER

5

724

724

SCS

WORKSTATION MONITOR KIT W/HDWR

657685

770065

770065

SCS

VERIFICATION TESTER FOR 724 725

7

CTC061-3-243-WW

CTC061-3-243-WW

SCS

ESD MONITOR WS AWARE DUAL W/B-B

25

770079

770079

SCS

GROUND MASTER MONITOR ETH

30

CTM051

CTM051

SCS

GROUND PRO GND INTEGRITY METER

4

CTC065-RT-T

CTC065-RT-T

SCS

EQUIPMENT MONITOR DIGITAL

0

CTC334-WW

CTC334-WW

SCS

GROUND MAN PLUS - GROUND MONITOR

8

770761

770761

SCS

RESISTANCE PRO METER

24

770062

770062

SCS

WS AWARE MONITOR BIG BROTHER REM

2

770724

770724

SCS

724 PLUS WORKSTATION MONITOR

38532

CTC337-WW

CTC337-WW

SCS

WRIST STRAP AND GROUND MONITOR

2

770758

770758

SCS

TESTER DUAL COMBINATION

119

770051

770051

SCS

ESD EVENT DIAGNOSTIC KIT

2

724MO

724MO

SCS

WORKSTATION MONITOR WRIST STRAPS

55

CTC062-3-242-WW

CTC062-3-242-WW

SCS

WS AWARE 4.20MA W/WW PS

0

740

740

SCS

WRIST STRAP/FOOTWEAR TESTER

0

Monitors, Testers

1. Overview

Static control, electrostatic discharge (ESD) protection, and clean room monitoring/test equipment are critical for maintaining product integrity in precision manufacturing environments. These devices ensure compliance with international standards (e.g., ISO 14644-1, ANSI/ESD S20.20) by quantifying electrostatic fields, particle contamination, and environmental parameters. Their importance spans semiconductor fabrication, pharmaceutical production, aerospace engineering, and nanotechnology applications.

2. Major Types & Functional Classification

TypeFunctional FeaturesApplication Examples
Electrostatic Field MetersMeasures electric field strength ( 1 kV/m to 100 kV/m), polarity detectionWafer handling areas in semiconductor plants
Laser Particle CountersCounts particles 0.1 m, real-time data loggingISO Class 3 clean rooms for photolithography
Surface Resistance TestersMeasures resistance (10^3-10^18 ), non-contact operationESD mat validation in electronics assembly lines
Personnel Grounding MonitorsTests wrist strap/footwear continuity, 5% accuracyPharmaceutical clean rooms with GMP compliance

3. Structural & Technical Composition

Typical systems integrate: (1) Sensor arrays (capacitive, laser diodes, or conductive probes), (2) Signal processing units with 24-bit ADCs, (3) HMI interfaces (LCD/touchscreens), (4) Communication modules (RS-485, Ethernet/IP67). Advanced models feature HEPA-filtered air sampling systems and AI-driven anomaly detection algorithms.

4. Key Technical Parameters

ParameterTypical Range/ValueImportance
Measurement Accuracy 1-5% of readingDetermines compliance with specifications
Response Time50 ms - 5 secEnables real-time process adjustments
Particle Size Range0.01-10 mDefines contamination control capability
Operating Temperature0-50 CAffects measurement stability

5. Application Fields

Key industries include: - Semiconductor manufacturing (photolithography tool monitoring) - Biopharmaceuticals (Grade A/B room certification) - Aerospace (fuel system component assembly) - Data centers (server rack ESD protection) - Medical device production (Class 8 clean rooms)

6. Leading Manufacturers & Products

VendorRepresentative ProductKey Features
Keysight TechnologiesU1282A ESD AnalyzerReal-time spectral analysis, 0.1 fF resolution
Lighthouse WorldwideLASAIR III Particle Counter1 CFM flow rate, 0.1 m sensitivity
Sanyo DenkiSan-Ei LP-312 ESD MonitorDual-axis field detection, USB interface

7. Selection Guidelines

Consider: (1) Measurement range vs. process requirements, (2) Calibration traceability to NIST standards, (3) Environmental compatibility (humidity/temperature ranges), (4) Integration with SCADA systems, (5) Lifecycle maintenance costs. For clean rooms, verify compliance with ISO 14644-1 classification requirements.

8. Industry Trends

Emerging developments include: - IoT-enabled predictive maintenance systems - MEMS-based miniaturized particle sensors - AI-powered contamination source tracking - Increased demand for sub-10 nm particle detection in quantum computing facilities - Hybrid ESD/cleanliness monitoring platforms with digital twin integration

RFQ BOM Call Skype Email
Top