| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
SCS |
MONITOR WRIST STRAP AND GROUND |
25 |
|
 |
SCS |
TEST KIT STATIC CTRL SURFACES |
995 |
|
 |
SCS |
TESTER, COMBO WRIST STRAP & FOOT |
20 |
|
 |
SCS |
IRON MAN PLUS SLDR IRON MONITOR |
29 |
|
 |
SCS |
SMP DIAGNOSTIC KIT |
2 |
|
 |
SCS |
MONITOR WRIST STRAP DUAL COND |
12768 |
|
 |
SCS |
GROUND MASTER GROUND MONITOR |
12 |
|
 |
SCS |
VERIFICATION TESTER |
34 |
|
 |
SCS |
WRIST STRAP TESTER AC TYPE |
0 |
|
 |
SCS |
WORKSTATION MONITOR CHECKER |
0 |
|
 |
SCS |
WS AWARE 4 MTL 0/20MA CTA242 |
0 |
|
 |
SCS |
ESD MONITOR WS AWARE DUAL |
7 |
|
 |
SCS |
TESTER SHOES/WRIST STRAP CERT |
0 |
|
 |
SCS |
ESD MONITOR WS AWARE DUAL |
7 |
|
 |
SCS |
CHARGE ANALYZER CERTIFIED |
0 |
|
 |
SCS |
TESTER, COMBO WRIST STRAP & FOOT |
469 |
|
 |
SCS |
MEGOHMMETER |
4 |
|
 |
SCS |
ESD PRO EVENT DETECTOR W/CASE |
3 |
|
 |
SCS |
AIR IONIZER TEST KIT |
12 |
|
 |
SCS |
RESISTANCE PRO METER KIT |
16 |
|
Static control, electrostatic discharge (ESD) protection, and clean room monitoring/test equipment are critical for maintaining product integrity in precision manufacturing environments. These devices ensure compliance with international standards (e.g., ISO 14644-1, ANSI/ESD S20.20) by quantifying electrostatic fields, particle contamination, and environmental parameters. Their importance spans semiconductor fabrication, pharmaceutical production, aerospace engineering, and nanotechnology applications.
| Type | Functional Features | Application Examples |
|---|---|---|
| Electrostatic Field Meters | Measures electric field strength ( 1 kV/m to 100 kV/m), polarity detection | Wafer handling areas in semiconductor plants |
| Laser Particle Counters | Counts particles 0.1 m, real-time data logging | ISO Class 3 clean rooms for photolithography |
| Surface Resistance Testers | Measures resistance (10^3-10^18 ), non-contact operation | ESD mat validation in electronics assembly lines |
| Personnel Grounding Monitors | Tests wrist strap/footwear continuity, 5% accuracy | Pharmaceutical clean rooms with GMP compliance |
Typical systems integrate: (1) Sensor arrays (capacitive, laser diodes, or conductive probes), (2) Signal processing units with 24-bit ADCs, (3) HMI interfaces (LCD/touchscreens), (4) Communication modules (RS-485, Ethernet/IP67). Advanced models feature HEPA-filtered air sampling systems and AI-driven anomaly detection algorithms.
| Parameter | Typical Range/Value | Importance |
|---|---|---|
| Measurement Accuracy | 1-5% of reading | Determines compliance with specifications |
| Response Time | 50 ms - 5 sec | Enables real-time process adjustments |
| Particle Size Range | 0.01-10 m | Defines contamination control capability |
| Operating Temperature | 0-50 C | Affects measurement stability |
Key industries include: - Semiconductor manufacturing (photolithography tool monitoring) - Biopharmaceuticals (Grade A/B room certification) - Aerospace (fuel system component assembly) - Data centers (server rack ESD protection) - Medical device production (Class 8 clean rooms)
| Vendor | Representative Product | Key Features |
|---|---|---|
| Keysight Technologies | U1282A ESD Analyzer | Real-time spectral analysis, 0.1 fF resolution |
| Lighthouse Worldwide | LASAIR III Particle Counter | 1 CFM flow rate, 0.1 m sensitivity |
| Sanyo Denki | San-Ei LP-312 ESD Monitor | Dual-axis field detection, USB interface |
Consider: (1) Measurement range vs. process requirements, (2) Calibration traceability to NIST standards, (3) Environmental compatibility (humidity/temperature ranges), (4) Integration with SCADA systems, (5) Lifecycle maintenance costs. For clean rooms, verify compliance with ISO 14644-1 classification requirements.
Emerging developments include: - IoT-enabled predictive maintenance systems - MEMS-based miniaturized particle sensors - AI-powered contamination source tracking - Increased demand for sub-10 nm particle detection in quantum computing facilities - Hybrid ESD/cleanliness monitoring platforms with digital twin integration