Cameras

Image Part Number Description / PDF Quantity Rfq
26100-253

26100-253

Aven

CAMERA 1280 X 1024 VGA

1

26100-244

26100-244

Aven

CAMERA 2592 X 1944 USB

16

26100-253HD

26100-253HD

Aven

CAMERA 1920 X 1080 HDMI

2

26100-221

26100-221

Aven

CAMERA 1616 X 1216 USB

0

26100-212

26100-212

Aven

CAMERA 1440 X 1080 USB

1

26100-222

26100-222

Aven

CAMERA 2080 X 1536 USB

0

26100-220

26100-220

Aven

CAMERA 1392 X 1040 USB

0

26100-102

26100-102

Aven

CAMERA 811 X 508 Y/C

0

26100-100

26100-100

Aven

CAMERA 811 X 508 S-VIDEO

1

26100-216

26100-216

Aven

CAMERA 2048 X 1536 USB

0

26100-215

26100-215

Aven

CAMERA 1280 X 1024 USB

0

26100-230

26100-230

Aven

CAMERA USB

1

Cameras

1. Overview

Optical inspection equipment cameras are specialized imaging devices designed for precision detection and analysis in industrial and scientific applications. By converting optical signals into digital data, these cameras enable automated quality control, defect detection, and process monitoring. Their importance in modern manufacturing and R&D environments stems from their ability to ensure product consistency, reduce human error, and accelerate production speeds.

2. Main Types and Functional Classification

TypeFunctional FeaturesApplication Examples
Industrial CCD CamerasHigh sensitivity, low noise, precise color reproductionPCB solder joint inspection
CMOS High-Speed CamerasHigh frame rates (up to 100,000 fps), low power consumptionAutomotive component impact testing
Hyperspectral CamerasMulti-band spectral analysis (400-2500 nm)Semiconductor material defect detection
Line Scan CamerasContinuous imaging of moving objects, high resolution (up to 16k pixels)Steel coil surface inspection
3D Depth CamerasStructured light/time-of-flight measurement, point cloud generationRobot guidance for logistics sorting

3. Structure and Components

Typical physical structure includes:

  • Lens assembly (C /TC mount, adjustable aperture)
  • Image sensor (CCD/CMOS with microlens array)
  • Image processing unit (FPGA/DSP for real-time algorithms)
  • Communication interface (GigE Vision/USB3.0/Camera Link)
  • Environmental protection housing (IP65/67 rating)

Technical composition involves: Optical filtering modules, temperature-controlled sensor chambers, and embedded machine vision libraries.

4. Key Technical Specifications

ParameterDescriptionImportance
ResolutionPixel count (e.g., 0.3-100 MP)Determines detection accuracy
Frame RateImages per second (1-100,000 fps)Affects production line speed
Sensor SizePhysical dimensions (1"-4")Impacts field of view and light collection
Spectral RangeWavelength sensitivity (UV/VIS/NIR/SWIR)Material analysis capability
Interface TypeData transmission standardSystem compatibility
Dynamic RangeSignal-to-noise ratio (60-120 dB)Defect contrast visibility

5. Application Fields

  • Electronics manufacturing: AOI systems for SMT solder paste inspection
  • Automotive industry: Engine component dimensional measurement
  • Semiconductor: Wafer micro-crack detection (sub- m resolution)
  • Pharmaceuticals: Tablet coating integrity analysis
  • Lithium battery production: Electrode sheet defect detection (0.01mm precision)

6. Leading Manufacturers and Products

ManufacturerRepresentative ProductKey Specifications
Basler AGace acA2440-35uc2448x2048 resolution, USB3.0, 35 fps
KeyenceVX Series XG-1000Multi-spectral imaging, 0.1 m precision
CognexDSMax HDHigh-dynamic-range CMOS, IP69K rating
Teledyne DALSAPiranha4 8k ColorLine scan, 100kHz line rate
FLIR SystemsBlackfly S BFS-U3-51S5C5120x3840 resolution, global shutter

7. Selection Recommendations

Key consideration factors:

  • Match sensor resolution to minimum defect size (e.g., 5 m defects require 5MP camera)
  • Calculate required frame rate using formula: Frame Rate (Production Speed FOV Width) / (Sensor Width 0.8)
  • Select spectral response based on material properties (e.g., SWIR for silicon wafer imaging)
  • Environmental adaptation (temperature/humidity/vibration resistance)
  • Total system cost (including lenses, lighting, and processing hardware)

Example: For lithium battery electrode inspection at 2m/s with 10 m defect detection, select a 5MP camera with 100fps frame rate and telecentric lens.

8. Industry Trend Analysis

Key development trends:

  • Resolution advancement: 200+MP sensors entering mass production
  • AI integration: On-camera neural processing units (NPUs) for edge computing
  • Spectral fusion: Multi/hyperspectral imaging becoming standard
  • Miniaturization: Wafer-level lens technologies reducing camera size
  • Standardization: Emergence of MIPI A-PHY for automotive vision systems

Market forecasts indicate a CAGR of 8.2% through 2030, driven by semiconductor and EV manufacturing demands.

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