Cameras

Image Part Number Description / PDF Quantity Rfq
AM4025X

AM4025X

Dunwell Tech, Inc.

1.3MP MICROSCOPE EYEPIECE CAMERA

10

VE-LX1800

VE-LX1800

Velab Co.

VE-LX1800 18.0 MP USB PC CAMERA

30

C1_MICRO_KIT1

C1_MICRO_KIT1

KUROKESU

DRONE USB CAMERA H.264 KIT

0

C1_PRO_KIT1

C1_PRO_KIT1

KUROKESU

INDUSTRIAL USB CAMERA H.264 KIT

2

VE-MC3

VE-MC3

Velab Co.

3.0 MP MICROSCOPE CAMERA

0

VE-LX1000

VE-LX1000

Velab Co.

10.0 MP USB PC CAMERA

30

AM7025X

AM7025X

Dunwell Tech, Inc.

5MP MICROSCOPE EYEPIECE CAMERA

7

26100-254

26100-254

Aven

CAMERA 1440 X 900 HDMI

11

VE-LX1400

VE-LX1400

Velab Co.

VE-LX1400 14.0 MP USB PC CAMERA

30

VE-MC5

VE-MC5

Velab Co.

5.0 MP MICROSCOPE CAMERA

30

VE-WUCAM0720PA

VE-WUCAM0720PA

Velab Co.

VE-WUCAM0720PA 2.0 MP W/WIFI

30

14305

14305

O.C. White Co.

5MP HYBRID HDMI/USB CAMER

0

26100-258

26100-258

Aven

MIGHTY CAM AUTO 1080P

517

26100-257UD

26100-257UD

Aven

MIGHTY CAM AUTO 2M 1080P HDMI

23

26100-252

26100-252

Aven

CAMERA 1280 X 720 VGA

1

26100-255

26100-255

Aven

CAMERA 1280 X 720 HDMI

3

26100-243

26100-243

Aven

CAMERA 2592 X 1944 USB

1

26100-245

26100-245

Aven

CAMERA 1360 X 1024 USB

2

26100-240

26100-240

Aven

CAMERA 1280 X 1024 USB

1

26100-241

26100-241

Aven

CAMERA 2048 X 1536 USB

1

Cameras

1. Overview

Optical inspection equipment cameras are specialized imaging devices designed for precision detection and analysis in industrial and scientific applications. By converting optical signals into digital data, these cameras enable automated quality control, defect detection, and process monitoring. Their importance in modern manufacturing and R&D environments stems from their ability to ensure product consistency, reduce human error, and accelerate production speeds.

2. Main Types and Functional Classification

TypeFunctional FeaturesApplication Examples
Industrial CCD CamerasHigh sensitivity, low noise, precise color reproductionPCB solder joint inspection
CMOS High-Speed CamerasHigh frame rates (up to 100,000 fps), low power consumptionAutomotive component impact testing
Hyperspectral CamerasMulti-band spectral analysis (400-2500 nm)Semiconductor material defect detection
Line Scan CamerasContinuous imaging of moving objects, high resolution (up to 16k pixels)Steel coil surface inspection
3D Depth CamerasStructured light/time-of-flight measurement, point cloud generationRobot guidance for logistics sorting

3. Structure and Components

Typical physical structure includes:

  • Lens assembly (C /TC mount, adjustable aperture)
  • Image sensor (CCD/CMOS with microlens array)
  • Image processing unit (FPGA/DSP for real-time algorithms)
  • Communication interface (GigE Vision/USB3.0/Camera Link)
  • Environmental protection housing (IP65/67 rating)

Technical composition involves: Optical filtering modules, temperature-controlled sensor chambers, and embedded machine vision libraries.

4. Key Technical Specifications

ParameterDescriptionImportance
ResolutionPixel count (e.g., 0.3-100 MP)Determines detection accuracy
Frame RateImages per second (1-100,000 fps)Affects production line speed
Sensor SizePhysical dimensions (1"-4")Impacts field of view and light collection
Spectral RangeWavelength sensitivity (UV/VIS/NIR/SWIR)Material analysis capability
Interface TypeData transmission standardSystem compatibility
Dynamic RangeSignal-to-noise ratio (60-120 dB)Defect contrast visibility

5. Application Fields

  • Electronics manufacturing: AOI systems for SMT solder paste inspection
  • Automotive industry: Engine component dimensional measurement
  • Semiconductor: Wafer micro-crack detection (sub- m resolution)
  • Pharmaceuticals: Tablet coating integrity analysis
  • Lithium battery production: Electrode sheet defect detection (0.01mm precision)

6. Leading Manufacturers and Products

ManufacturerRepresentative ProductKey Specifications
Basler AGace acA2440-35uc2448x2048 resolution, USB3.0, 35 fps
KeyenceVX Series XG-1000Multi-spectral imaging, 0.1 m precision
CognexDSMax HDHigh-dynamic-range CMOS, IP69K rating
Teledyne DALSAPiranha4 8k ColorLine scan, 100kHz line rate
FLIR SystemsBlackfly S BFS-U3-51S5C5120x3840 resolution, global shutter

7. Selection Recommendations

Key consideration factors:

  • Match sensor resolution to minimum defect size (e.g., 5 m defects require 5MP camera)
  • Calculate required frame rate using formula: Frame Rate (Production Speed FOV Width) / (Sensor Width 0.8)
  • Select spectral response based on material properties (e.g., SWIR for silicon wafer imaging)
  • Environmental adaptation (temperature/humidity/vibration resistance)
  • Total system cost (including lenses, lighting, and processing hardware)

Example: For lithium battery electrode inspection at 2m/s with 10 m defect detection, select a 5MP camera with 100fps frame rate and telecentric lens.

8. Industry Trend Analysis

Key development trends:

  • Resolution advancement: 200+MP sensors entering mass production
  • AI integration: On-camera neural processing units (NPUs) for edge computing
  • Spectral fusion: Multi/hyperspectral imaging becoming standard
  • Miniaturization: Wafer-level lens technologies reducing camera size
  • Standardization: Emergence of MIPI A-PHY for automotive vision systems

Market forecasts indicate a CAGR of 8.2% through 2030, driven by semiconductor and EV manufacturing demands.

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