Accessories

Image Part Number Description / PDF Quantity Rfq
26700-405

26700-405

Aven

LCD MONITR 8" HD WITH HDMI INPUT

1

MV-RN15F

MV-RN15F

Panasonic

SCOPE: FLEXIBLE CABLE 1000MM

0

26501-RBLED

26501-RBLED

Aven

REPLACEMENT LED BOARD

0

MV-RN15K

MV-RN15K

Panasonic

SCOPE: FIXED CABLE 1000MM

0

VPI-FOT

VPI-FOT

Tronex (Menda/EasyBraid/Tronex)

FLAT FIBER OPTIC TIP ASSY 2PCS

0

580100-314

580100-314

Excelitas Technologies

A-ZM MICRO, ANALYZER

0

504617-1

504617-1

TE Connectivity AMP Connectors

FC/APC ADAPTER MICROSCOPE 10X

0

26800B-435

26800B-435

Aven

ADAPTER FOR CCD CAMERAS

2

504618-2

504618-2

TE Connectivity AMP Connectors

SC/APC ADAPTER MICROSCOPE 20X

0

1278997-1

1278997-1

TE Connectivity AMP Connectors

MICROSCOPE ADAPTR LC 1.25FERRULE

0

VSC80-2R

VSC80-2R

FLIR

8MM CAM W 2M SEMI-RIGID PROBE -

0

26800B-476

26800B-476

Aven

GLIDING STAGE 300MM X 210MM

1

502964-1

502964-1

TE Connectivity AMP Connectors

MICROSCOPE BULB 2.8V

0

26700-506

26700-506

Aven

ILOUPE CARRYING CASE

2

502977-1

502977-1

TE Connectivity AMP Connectors

ADAPTER F/OPTIC MICROSCOPE SC

0

492048-1

492048-1

TE Connectivity AMP Connectors

MICROSCOPE ADAPT UNIV 2.5MMX20

0

26200A-212

26200A-212

Aven

ADAPTER FOR 1.125IN ID RING LGHT

30

26800B-474

26800B-474

Aven

GLIDING STAGE ROTATING 135MM

0

502971-1

502971-1

TE Connectivity AMP Connectors

MICROSCOPE ADAPTER FSMA

0

1828835-1

1828835-1

TE Connectivity AMP Connectors

MPXA MICROSCOPE ADAPTER

0

Accessories

1. Overview

Optical inspection equipment accessories are modular components that enhance the functionality, precision, and adaptability of optical inspection systems. These accessories include illumination sources, lenses, sensors, filters, and software modules. They play a critical role in industrial quality control, semiconductor manufacturing, biomedical imaging, and precision measurement by enabling accurate defect detection, dimensional analysis, and material characterization.

2. Major Types and Functional Classification

TypeFunctional CharacteristicsApplication Examples
High-Intensity LED LightingUniform illumination, adjustable wavelength, low thermal emissionSurface defect detection in PCB manufacturing
Telecentric LensesMinimize perspective errors, maintain constant magnificationPrecision metrology in semiconductor wafer inspection
Hyperspectral Imaging SensorsCapture spectral and spatial data simultaneouslyMaterial analysis in food quality control
Optical FiltersSelective wavelength transmission/reflectionFluorescence imaging in biomedical diagnostics
Motorized XY StagesHigh-precision positioning with sub-micron resolutionAutomated sample scanning in R&D laboratories

3. Structural and Technical Composition

A typical accessory system consists of:
- Mechanical housing with vibration-damping mounts
- Optical components (lenses, prisms, diffraction gratings)
- Electronic control units with interface ports (USB 3.0, GigE Vision)
- Calibration modules for environmental compensation
- Software development kits (SDKs) for system integration

4. Key Technical Specifications

ParameterDescriptionImportance
ResolutionMinimum detectable feature size (1-10 m range)Determines defect detection capability
Wavelength RangeOperational spectral band (UV-VIS-NIR: 200-2500 nm)Material interaction specificity
Working DistanceOptimal object-to-lens distance (10-200 mm)System design flexibility
Data Transfer RateUp to 10 Gbps via CoaXPress interfacesReal-time inspection throughput
Environmental ToleranceOperating temperature (0-50 C), humidity resistanceSystem reliability in industrial settings

5. Application Fields

  • Semiconductor manufacturing (wafer defect inspection)
  • Electronics assembly (AOI systems for solder joint analysis)
  • Medical diagnostics (digital pathology scanners)
  • Automotive industry (surface finish measurement)
  • Pharmaceutical packaging (print quality verification)

6. Leading Manufacturers and Representative Products

ManufacturerProduct SeriesKey Specifications
KeyenceCV-X4 Series ControllersMulti-sensor fusion, 0.1 m resolution
CognexDVT Summit SeriesEmbedded vision systems with AI algorithms
OlympusStream Essentials Software3D surface analysis for metallurgy
CCS OptoLDR2-50SW2 LightingStrobe synchronization at 50,000 lx output

7. Selection Recommendations

Key considerations include:
- Matching numerical aperture (NA) with required depth of field
- Spectral compatibility between light sources and sensors
- Environmental sealing (IP ratings for dusty/humid environments)
- Software API compatibility with existing automation systems
- Calibration certification (NIST traceability preferred)

8. Industry Trends Analysis

Current development trends include:
- Integration of AI-powered defect classification algorithms
- Miniaturization through MEMS-based optical components
- Multi-spectral imaging combining visible and thermal IR bands
- Standardization of plug-and-play interfaces (USB4 Vision, XCP)

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