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Test Probe Tips

Image Part Number Description / PDF Quantity Rfq
CT3941

CT3941

Cal Test Electronics

EXTENDED TIP, STAINLESS, 3900 SE

0
A054B

A054B

TPI (Test Products International)

OEM PROD BLACK

0
CT3212

CT3212

Cal Test Electronics

FUSED MODULAR PROBES 0.5A/1000V

6
72-019

72-019

NTE Electronics, Inc.

LANTERN PROBE RED

16
TP1

TP1

Fluke Electronics

TEST PROBES SLIM REACH FLT BLADE

0
TOP075T12/280G

TOP075T12/280G

Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

5000
P13-4023

P13-4023

Harwin

1.27MM CENTER TWO PART PROBE

4128
CT2961A

CT2961A

Cal Test Electronics

HOOK TIP HV PROBE 5MM THD GOLD P

63
PK30X-4

PK30X-4

Teledyne LeCroy

BANANA CLAMP CLIPS

3
FC-A18

FC-A18

REED Instruments

ELECTRONIC TEST PROBE SET

0
PK007-004

PK007-004

Teledyne LeCroy

RIGID TIP SER

32
A057B

A057B

TPI (Test Products International)

NEEDLE BACK PROBE ADAPTER BLACK

0
A055B

A055B

TPI (Test Products International)

STANLES STEEL TIP PROD THIN BLK

0
72-012

72-012

NTE Electronics, Inc.

STANDARD PROBE BLACK

4
CT2387-0

CT2387-0

Cal Test Electronics

SPRINGTIP MINIPROBE 2MM JACK BLK

7
A039R

A039R

TPI (Test Products International)

SPADE TERMINAL RED

0
P13-1123

P13-1123

Harwin

1.27MM CENTER TWO PART PROBE

1120
72923-2

72923-2

Pomona Electronics

SMD TEST PROBE SPRING MNTDED TIP

18
CT2266-0

CT2266-0

Cal Test Electronics

PROBE BODY 2MM TIP BLACK

65
CT2988

CT2988

Cal Test Electronics

PROBE BODY SET 2MM TIP PAIR B/R

64

Test Probe Tips

1. Overview

Test Probe Tips are critical components in electronic measurement systems, serving as the physical interface between testing instruments (e.g., oscilloscopes, multimeters) and devices under test (DUTs). They condition signals by maintaining signal integrity, minimizing noise, and ensuring accurate data acquisition. Their importance spans industries such as semiconductor development, telecommunications, and automotive electronics, where precise measurements are essential for design validation and quality assurance.

2. Main Types and Functional Classification

TypeFunctional FeaturesApplication Examples
Passive Voltage ProbesHigh impedance (10M ), no external power required, 1:1 or 10:1 attenuationGeneral-purpose circuit debugging, power supply testing
Active Voltage ProbesPowered design, 50 termination, bandwidth >1GHz, low capacitive loadingHigh-speed digital circuits (e.g., DDR5 memory testing)
Differential ProbesMeasures voltage between two points, CMRR >100dB at 1MHzSwitching power supply analysis, CAN bus signal testing
Current ProbesNon-invasive measurement via Hall effect or Rogowski coil, AC/DC capabilityMotor drive current analysis, battery consumption testing
High-Voltage Probes8kV-40kV rating, Class 1 safety compliance, 100:1 attenuation ratioPower grid equipment testing, X-ray machine diagnostics

3. Structure and Components

A standard probe tip assembly consists of:

  • Probe Head: Precision-machined conductive tip (tungsten or phosphor bronze) with insulation sleeve
  • Connection Interface: BNC/SMA/SMC connectors or proprietary interfaces (e.g., TekVPI)
  • Transmission Path: Coaxial cable with controlled impedance (50 or 100 ) and EMI shielding
  • Compensation Circuits: Adjustable RC networks for frequency response optimization
  • Mechanical Strain Relief: Polymer overmolding to prevent cable fatigue failures

4. Key Technical Specifications

ParameterDescriptionImportance
BandwidthFrequency range maintaining 2dB amplitude accuracy (e.g., 500MHz-8GHz)Determines measurable signal speed and edge definition
Attenuation RatioSignal scaling factor (e.g., 10:1 reduces scope input by 10x)Protects instruments from overvoltage while maintaining measurement range
Input CapacitanceParasitic capacitance at probe tip (<1pF for active probes)Lower values reduce circuit loading effects in high-speed applications
Rise TimeFastest measurable edge transition (e.g., 35ps for 10Gbps signals)Critical for timing analysis in digital systems
Withstand VoltageMax non-destructive voltage rating (e.g., 40kV CAT III)Safety compliance for industrial and power electronics testing

5. Application Fields

Key industries include:

  • Consumer Electronics: Mobile chip validation using 10GHz active probes
  • Automotive: CAN FD bus testing with isolated differential probes
  • Renewable Energy: IGBT switching analysis in solar inverters via high-voltage tips
  • Medical Devices: ECG signal acquisition with ultra-low noise passive probes
  • Aerospace: Avionics signal integrity testing at 67GHz millimeter-wave frequencies

6. Leading Manufacturers and Products

ManufacturerFlagship ProductKey Specifications
Keysight TechnologiesN2872A High-Z Passive Probe500MHz bandwidth, 4kV rating, 10:1 attenuation
Teledyne LeCroyPP018 High-Speed Active Probe8GHz bandwidth, 0.5pF input capacitance
Flukei430-Flex Current Probe150A/5500A range, 1Hz-100kHz frequency response
Rohde & SchwarzRTH-HV High-Voltage Probe6kV differential measurement capability

7. Selection Recommendations

Key selection criteria:

  • Match probe bandwidth to 3-5 signal frequency for accurate rise time measurement
  • Select attenuation ratio based on DUT voltage levels and instrument input range
  • For differential signals, ensure CMRR > 60dB at target frequencies
  • Consider probe loading effects: Zprobe 10 Zcircuit
  • Environmental factors: Temperature range (-40 C to +150 C), vibration resistance

8. Industry Trends

Emerging trends include:

  • Integration of MEMS-based capacitive sensors for sub-picosecond timing resolution
  • Development of 112Gbps-compatible active probes with on-tip signal conditioning
  • Adoption of optical interconnects to eliminate ground loops in RF measurements
  • Growing demand for multi-function probes combining voltage/current/temperature sensing
  • AI-driven probe health monitoring systems for predictive maintenance in production lines

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