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Test Probe Tips

Image Part Number Description / PDF Quantity Rfq
930144101

930144101

Altech Corporation

TEST SOCKETPKNI 20 B RED 4MM TES

0
972363188

972363188

Altech Corporation

TEST SOCKET SEP 2630 YG 4MM TEST

0
972317100

972317100

Altech Corporation

TESTPROBEPRUEF 2600 BLK STATIONA

0
930166100

930166100

Altech Corporation

TEST SOCKET BIL 30 BLK 4MM TEST

220
972361104

972361104

Altech Corporation

TEST SOCKET SEP 2610 GRN 4MM TES

0
930308104

930308104

Altech Corporation

TEST SOCKET MBI 1 GRN 2MM SOCKET

60
973501101

973501101

Altech Corporation

TESTPROBE KLEPS 2 BU REDPLUNGER

5
930308704

930308704

Altech Corporation

TEST SOCKET MBI 1 AU GRN 2MM SOC

0
930176706

930176706

Altech Corporation

TEST SOCKET BIL 20 AU GRY 4MM TE

0
CT3946B-2

CT3946B-2

Cal Test Electronics

SPRUNG HOOK ADAPTER 3900B UL RED

0
972309101

972309101

Altech Corporation

TESTPROBE KLEPS 2900 REDPLUNGER

10
930166700

930166700

Altech Corporation

TEST SOCKET BIL 30 AU BLK 4MM TE

200
930268101

930268101

Altech Corporation

TEST SOCKET MPK 1 RED 2MM TEST S

0
930308702

930308702

Altech Corporation

TEST SOCKET MBI 1 AU BLUE 2MM SO

0
934096101

934096101

Altech Corporation

TEST SOCKET KUN S RED 4MM TEST A

40
0625001847

0625001847

Woodhead - Molex

TEST PROBE

0
30BLK

30BLK

E-Z-Hook

PROBE PIN TIP BLACK

0
441589S

441589S

TPI (Test Products International)

THREADED REPLACEMENT TIP SP100B

491
930166109

930166109

Altech Corporation

TEST SOCKET BIL 30PURPLE 4MM TES

0
972355109

972355109

Altech Corporation

TEST SOCKET SEB 2610PURPLE 4MM T

0

Test Probe Tips

1. Overview

Test Probe Tips are critical components in electronic measurement systems, serving as the physical interface between testing instruments (e.g., oscilloscopes, multimeters) and devices under test (DUTs). They condition signals by maintaining signal integrity, minimizing noise, and ensuring accurate data acquisition. Their importance spans industries such as semiconductor development, telecommunications, and automotive electronics, where precise measurements are essential for design validation and quality assurance.

2. Main Types and Functional Classification

TypeFunctional FeaturesApplication Examples
Passive Voltage ProbesHigh impedance (10M ), no external power required, 1:1 or 10:1 attenuationGeneral-purpose circuit debugging, power supply testing
Active Voltage ProbesPowered design, 50 termination, bandwidth >1GHz, low capacitive loadingHigh-speed digital circuits (e.g., DDR5 memory testing)
Differential ProbesMeasures voltage between two points, CMRR >100dB at 1MHzSwitching power supply analysis, CAN bus signal testing
Current ProbesNon-invasive measurement via Hall effect or Rogowski coil, AC/DC capabilityMotor drive current analysis, battery consumption testing
High-Voltage Probes8kV-40kV rating, Class 1 safety compliance, 100:1 attenuation ratioPower grid equipment testing, X-ray machine diagnostics

3. Structure and Components

A standard probe tip assembly consists of:

  • Probe Head: Precision-machined conductive tip (tungsten or phosphor bronze) with insulation sleeve
  • Connection Interface: BNC/SMA/SMC connectors or proprietary interfaces (e.g., TekVPI)
  • Transmission Path: Coaxial cable with controlled impedance (50 or 100 ) and EMI shielding
  • Compensation Circuits: Adjustable RC networks for frequency response optimization
  • Mechanical Strain Relief: Polymer overmolding to prevent cable fatigue failures

4. Key Technical Specifications

ParameterDescriptionImportance
BandwidthFrequency range maintaining 2dB amplitude accuracy (e.g., 500MHz-8GHz)Determines measurable signal speed and edge definition
Attenuation RatioSignal scaling factor (e.g., 10:1 reduces scope input by 10x)Protects instruments from overvoltage while maintaining measurement range
Input CapacitanceParasitic capacitance at probe tip (<1pF for active probes)Lower values reduce circuit loading effects in high-speed applications
Rise TimeFastest measurable edge transition (e.g., 35ps for 10Gbps signals)Critical for timing analysis in digital systems
Withstand VoltageMax non-destructive voltage rating (e.g., 40kV CAT III)Safety compliance for industrial and power electronics testing

5. Application Fields

Key industries include:

  • Consumer Electronics: Mobile chip validation using 10GHz active probes
  • Automotive: CAN FD bus testing with isolated differential probes
  • Renewable Energy: IGBT switching analysis in solar inverters via high-voltage tips
  • Medical Devices: ECG signal acquisition with ultra-low noise passive probes
  • Aerospace: Avionics signal integrity testing at 67GHz millimeter-wave frequencies

6. Leading Manufacturers and Products

ManufacturerFlagship ProductKey Specifications
Keysight TechnologiesN2872A High-Z Passive Probe500MHz bandwidth, 4kV rating, 10:1 attenuation
Teledyne LeCroyPP018 High-Speed Active Probe8GHz bandwidth, 0.5pF input capacitance
Flukei430-Flex Current Probe150A/5500A range, 1Hz-100kHz frequency response
Rohde & SchwarzRTH-HV High-Voltage Probe6kV differential measurement capability

7. Selection Recommendations

Key selection criteria:

  • Match probe bandwidth to 3-5 signal frequency for accurate rise time measurement
  • Select attenuation ratio based on DUT voltage levels and instrument input range
  • For differential signals, ensure CMRR > 60dB at target frequencies
  • Consider probe loading effects: Zprobe 10 Zcircuit
  • Environmental factors: Temperature range (-40 C to +150 C), vibration resistance

8. Industry Trends

Emerging trends include:

  • Integration of MEMS-based capacitive sensors for sub-picosecond timing resolution
  • Development of 112Gbps-compatible active probes with on-tip signal conditioning
  • Adoption of optical interconnects to eliminate ground loops in RF measurements
  • Growing demand for multi-function probes combining voltage/current/temperature sensing
  • AI-driven probe health monitoring systems for predictive maintenance in production lines

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