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Test Probe Tips

Image Part Number Description / PDF Quantity Rfq
930166101

930166101

Altech Corporation

TEST SOCKET BIL 30 RED 4MM TEST

260
TL747

TL747

FLIR Extech

ELECTRONIC SHARP TEST PROBE SET

0
972355107

972355107

Altech Corporation

TEST SOCKET SEB 2610 WHITE 4MM T

40
931804101

931804101

Altech Corporation

TEST SOCKET ADAPTER KUN 30 RED 4

0
930166706

930166706

Altech Corporation

TEST SOCKET BIL 30 AU GRY 4MM TE

0
CT3211-5

CT3211-5

Cal Test Electronics

FUSED MODULAR PROBE 0.5A/1000V G

0
930166703

930166703

Altech Corporation

TEST SOCKET BIL 30 AU YEL 4MM TE

0
5432-0

5432-0

Pomona Electronics

MINIATURE TEST PROBE BLACK

0
930166702

930166702

Altech Corporation

TEST SOCKET BIL 30 AU BLUE 4MM T

0
930757102

930757102

Altech Corporation

TEST SOCKETPKI 100 BLUE 4MM TEST

0
FI1000-LC-SQ-TIP

FI1000-LC-SQ-TIP

Phoenix Contact

LC BULKHEAD VIDEO PROBE TIP

0
930103102

930103102

Altech Corporation

TEST SOCKET PKI 10A BLUE 4MM M4

0
931804702

931804702

Altech Corporation

TEST SOCKET ADAPTER KUN 30 AU BL

0
930176104

930176104

Altech Corporation

TEST SOCKET BIL 20 GRN 4MM TEST

40
975018700

975018700

Altech Corporation

TESTPROBEPRUEF 1610 BLK SPRING L

15
972356100

972356100

Altech Corporation

TEST SOCKET SEB 2620 BLK 4MM TES

80
BU-26130-4

BU-26130-4

Mueller Electric Co.

TEST PROD

0
973531100

973531100

Altech Corporation

TESTPROBEPRUEF MPS1 BLK STATIONA

95
972319100

972319100

Altech Corporation

TESTPROBEPRUEF 2700 BLK STATIONA

0
972359104

972359104

Altech Corporation

TEST SOCKET SEB 2630 GRN 4MM TES

0

Test Probe Tips

1. Overview

Test Probe Tips are critical components in electronic measurement systems, serving as the physical interface between testing instruments (e.g., oscilloscopes, multimeters) and devices under test (DUTs). They condition signals by maintaining signal integrity, minimizing noise, and ensuring accurate data acquisition. Their importance spans industries such as semiconductor development, telecommunications, and automotive electronics, where precise measurements are essential for design validation and quality assurance.

2. Main Types and Functional Classification

TypeFunctional FeaturesApplication Examples
Passive Voltage ProbesHigh impedance (10M ), no external power required, 1:1 or 10:1 attenuationGeneral-purpose circuit debugging, power supply testing
Active Voltage ProbesPowered design, 50 termination, bandwidth >1GHz, low capacitive loadingHigh-speed digital circuits (e.g., DDR5 memory testing)
Differential ProbesMeasures voltage between two points, CMRR >100dB at 1MHzSwitching power supply analysis, CAN bus signal testing
Current ProbesNon-invasive measurement via Hall effect or Rogowski coil, AC/DC capabilityMotor drive current analysis, battery consumption testing
High-Voltage Probes8kV-40kV rating, Class 1 safety compliance, 100:1 attenuation ratioPower grid equipment testing, X-ray machine diagnostics

3. Structure and Components

A standard probe tip assembly consists of:

  • Probe Head: Precision-machined conductive tip (tungsten or phosphor bronze) with insulation sleeve
  • Connection Interface: BNC/SMA/SMC connectors or proprietary interfaces (e.g., TekVPI)
  • Transmission Path: Coaxial cable with controlled impedance (50 or 100 ) and EMI shielding
  • Compensation Circuits: Adjustable RC networks for frequency response optimization
  • Mechanical Strain Relief: Polymer overmolding to prevent cable fatigue failures

4. Key Technical Specifications

ParameterDescriptionImportance
BandwidthFrequency range maintaining 2dB amplitude accuracy (e.g., 500MHz-8GHz)Determines measurable signal speed and edge definition
Attenuation RatioSignal scaling factor (e.g., 10:1 reduces scope input by 10x)Protects instruments from overvoltage while maintaining measurement range
Input CapacitanceParasitic capacitance at probe tip (<1pF for active probes)Lower values reduce circuit loading effects in high-speed applications
Rise TimeFastest measurable edge transition (e.g., 35ps for 10Gbps signals)Critical for timing analysis in digital systems
Withstand VoltageMax non-destructive voltage rating (e.g., 40kV CAT III)Safety compliance for industrial and power electronics testing

5. Application Fields

Key industries include:

  • Consumer Electronics: Mobile chip validation using 10GHz active probes
  • Automotive: CAN FD bus testing with isolated differential probes
  • Renewable Energy: IGBT switching analysis in solar inverters via high-voltage tips
  • Medical Devices: ECG signal acquisition with ultra-low noise passive probes
  • Aerospace: Avionics signal integrity testing at 67GHz millimeter-wave frequencies

6. Leading Manufacturers and Products

ManufacturerFlagship ProductKey Specifications
Keysight TechnologiesN2872A High-Z Passive Probe500MHz bandwidth, 4kV rating, 10:1 attenuation
Teledyne LeCroyPP018 High-Speed Active Probe8GHz bandwidth, 0.5pF input capacitance
Flukei430-Flex Current Probe150A/5500A range, 1Hz-100kHz frequency response
Rohde & SchwarzRTH-HV High-Voltage Probe6kV differential measurement capability

7. Selection Recommendations

Key selection criteria:

  • Match probe bandwidth to 3-5 signal frequency for accurate rise time measurement
  • Select attenuation ratio based on DUT voltage levels and instrument input range
  • For differential signals, ensure CMRR > 60dB at target frequencies
  • Consider probe loading effects: Zprobe 10 Zcircuit
  • Environmental factors: Temperature range (-40 C to +150 C), vibration resistance

8. Industry Trends

Emerging trends include:

  • Integration of MEMS-based capacitive sensors for sub-picosecond timing resolution
  • Development of 112Gbps-compatible active probes with on-tip signal conditioning
  • Adoption of optical interconnects to eliminate ground loops in RF measurements
  • Growing demand for multi-function probes combining voltage/current/temperature sensing
  • AI-driven probe health monitoring systems for predictive maintenance in production lines

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