| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
Fluke Electronics |
OSCOPE PROBE X10 200MHZ 10M |
0 |
|
 |
Seeed |
OSCOPE PROBE X1/X10 1M |
0 |
|
 |
Fluke Electronics |
OSCOPE PROBE X10 300MHZ 1M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X1/X10/X20 1GHZ 1M |
0 |
|
 |
Amprobe |
OSCOPE PROBE X1K 1000M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X10 500MHZ 10M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X10 1.5GHZ 1M |
0 |
|
 |
TPI (Test Products International) |
OSCOPE PROBE X1/X10 60MHZ 1M/10M |
57 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE 60MHZ |
0 |
|
 |
Pomona Electronics |
OSCOPE P X1/X10 15/100MHZ 1M/10M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X10 500MHZ 10M 2PK |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X100 400MHZ 50M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE PROBE X10 500MHZ 10M |
0 |
|
 |
Teledyne LeCroy |
OSCOPE P X10/X100 200/300MHZ 50M |
0 |
|
 |
Cal Test Electronics |
OSCOPE PROBE X10 200MHZ 500K |
0 |
|
 |
Fluke Electronics |
OSCOPE PROBE X10 100MHZ |
0 |
|
 |
Pomona Electronics |
OSCOPE PROBE X10 350MHZ 10M |
0 |
|
 |
B&K Precision |
OSCOPE PROBE 100KHZ-650MHZ |
0 |
|
 |
Fluke Electronics |
OSCOPE PROBE X20/X200 20MHZ 1M |
0 |
|
 |
Fluke Electronics |
OSCOPE PROBE X1 12MHZ 1M |
0 |
|
Oscilloscope probes and test leads are critical interface components between electronic circuits under test and measurement instruments. They ensure accurate signal transmission while minimizing circuit loading effects. These probes convert physical electrical signals into measurable waveforms, enabling engineers to analyze voltage, current, timing, and signal integrity in real time. Their importance in modern electronics spans from R&D validation to field service diagnostics.
| Type | Functional Characteristics | Application Examples |
|---|---|---|
| Passive Voltage Probes | High impedance (10M ), 1:1 or 10:1 attenuation, no power required | Basic circuit troubleshooting, education labs |
| Active Voltage Probes | Powered design, 50k impedance, 1:1 attenuation, high bandwidth (>1GHz) | High-speed digital circuits, RF testing |
| Current Probes | Non-invasive measurement via Hall effect or current transformer | Switching power supplies, motor drives |
| Differential Probes | Measure voltage between two points, reject common-mode noise | High-voltage floating measurements, balanced circuits |
| Logic Probes | Digital signal detection with threshold indicators | Digital circuit debugging, embedded systems |
Typical probe construction includes: - Probe tip (spring-loaded or solderable contact) - Ground lead (short/adjustable length) - Coaxial cable (50 or 75 shielded) - Compensation network (variable capacitor for frequency response adjustment) - BNC/SMA interface (50 matched connector) - Attenuation switch (for 1x/10x selection) - Probe head (ergonomic design with overvoltage protection)
| Parameter | Description | Importance |
|---|---|---|
| Bandwidth | Frequency range (-3dB point) | Determines signal fidelity for high-speed transitions |
| Input Impedance | Resistance and capacitance presented to DUT | Affects circuit loading (typically 10M //15pF) |
| Attenuation Ratio | Signal scaling factor (e.g., 10:1) | Extends measurement range while maintaining impedance |
| Rise Time | Fastest measurable edge (10-90%) | Essential for digital signal analysis |
| Parasitic Capacitance | Tip capacitance (<1pF for active probes) | Impacts high-frequency measurement accuracy |
| CMRR | Common-mode rejection ratio | Critical for differential signal integrity |
| Manufacturer | Representative Product | Key Specifications |
|---|---|---|
| Tektronix | P6139B | 500MHz, 10:1 passive probe, 10M impedance |
| Keysight | N2790A | 2GHz active differential probe, 50k input |
| Fluke | i410sc | AC/DC current probe, 1500A range, 100kHz bandwidth |
| Rohde & Schwarz | RTH-HDO44 | 1GHz bandwidth, 4-channel logic probe |
| Siglent | SP2020 | 200MHz passive probe, 10M , 10:1 attenuation |
Key considerations include: - Bandwidth matching (3-5 signal frequency) - Impedance compatibility (10M for general use, 50 for high-speed) - Signal type (voltage/current/differential) - Environmental factors (temperature, vibration) - Safety ratings (CAT II/III for industrial environments) - Cost vs. performance trade-offs
Current trends include: - Development of 10GHz+ bandwidth active probes - Integration with AI-based signal integrity analysis - Wireless probe systems for hazardous environments - Enhanced EMI shielding for 5G/mmWave testing - Standardization of probe calibration procedures (ISO/IEC 17025) - Miniaturization for high-density PCB measurements