| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
Pomona Electronics |
BASIC ELECTRONIC TEST LEAD KIT |
48 |
|
 |
Pomona Electronics |
KIT TEST MULTI-USE SMD |
0 |
|
 |
Pomona Electronics |
PROBE/MULTI-STACK BANANA PLUG |
48 |
|
 |
Pomona Electronics |
KIT MAXI-TEST LEAD MULT-USE DMM |
10 |
|
 |
Pomona Electronics |
PROBE & LEAD KIT FOR PORTABLE SC |
0 |
|
|
Pomona Electronics |
KIT UNIVERSAL DSX-3 TEST |
0 |
|
|
Pomona Electronics |
AUTOMOTIVE DELUXE TEST LEAD SET |
0 |
|
|
Pomona Electronics |
KIT DMM TEST LEAD MULTI-USE |
0 |
|
 |
Pomona Electronics |
KIT TEST LEAD DELUXE ELECT DMM |
0 |
|
 |
Pomona Electronics |
KIT TEST LEAD DELUXE ELECTRC DMM |
0 |
|
 |
Pomona Electronics |
KIT WAVETEK XL & XT DMM |
0 |
|
 |
Pomona Electronics |
KIT FOR FLUKE 70 SERIES DMM |
0 |
|
 |
Pomona Electronics |
KIT SHIELDED TEST LEAD |
0 |
|
 |
Pomona Electronics |
TEST PROBE SET REPLACEABLE TIP |
0 |
|
 |
Pomona Electronics |
KIT DELUXE ELECT COMPANION TEST |
0 |
|
 |
Pomona Electronics |
KIT DELUXE INDUST TEST COMPANION |
0 |
|
 |
Pomona Electronics |
KIT INDUSTRIAL TEST COMPANION |
0 |
|
 |
Pomona Electronics |
KIT FOR FLUKE 20 & 70 SERIES DMM |
0 |
|
 |
Pomona Electronics |
KIT FOR FLUKE 70 SERIES DMM |
0 |
|
 |
Pomona Electronics |
KIT ELECTRONIC TEST COMPANION |
0 |
|
Test leads and measurement kits are essential components in electrical and electronic testing systems. They serve as physical interfaces between test equipment (multimeters, oscilloscopes, analyzers) and devices under test (DUTs). Modern test lead kits integrate multiple connector types, insulation materials, and mechanical designs to ensure accurate signal transmission, safety, and durability across diverse measurement scenarios.
| Type | Functional Features | Application Examples |
|---|---|---|
| Standard Test Lead Kits | Banana plugs, alligator clips, 4mm terminations | General electronics troubleshooting |
| High-Voltage Probes | 10:1 attenuation, 600V+ insulation rating | Power supply testing |
| Differential Voltage Probes | Isolated ground references, CMRR >100dB | Switching power supply analysis |
| Current Probes | Hall effect/CT sensors, AC/DC measurement | Motor current analysis |
| Oscilloscope Probe Kits | 50MHz-500MHz bandwidth, low capacitance | Digital signal integrity testing |
Typical test lead assemblies consist of: - Conductive core (annealed copper, 14-20 AWG) - Insulation layers (PVC/thermoplastic elastomer, 0.6-1.2mm thickness) - Connector interfaces (shrouded banana, BNC, SMB, or custom terminations) - Mechanical strain relief (overmolded stress relief points) - Color-coded sleeves (for circuit identification) High-performance kits incorporate shielding layers (braided copper/aluminum foil) to minimize EMI interference.
| Parameter | Typical Range | Importance |
|---|---|---|
| Lead Resistance | 0.05-0.3 /m | Impacts measurement accuracy |
| Insulation Resistance | 100M -10G | Ensures operator safety |
| Capacitance | 10-100 pF | Affects high-frequency response |
| Working Voltage | 60V-1000V CAT III | Determines application suitability |
| Temperature Range | -20 C to +85 C | Environmental reliability |
Primary industries include: - Electronics manufacturing (PCB testing, component validation) - Power systems (transformer diagnostics, grid maintenance) - Automotive (ECU signal analysis, CAN bus measurement) - Aerospace (avionics signal integrity verification) - Biomedical (ECG machine calibration, implantable device testing) Typical equipment: Digital multimeters, oscilloscopes, insulation resistance testers.
| Manufacturer | Representative Product | Key Features |
|---|---|---|
| Fluke | TLK-PS1 Power Supply Kit | CAT III 1000V rating, 1.2m leads |
| Keysight | N2890A Scope Probe Kit | 500MHz bandwidth, 10:1 attenuation |
| Teledyne LeCroy | PP008 Differential Probe | 250V differential range, 50MHz |
| Hioki | 9687 AC/DC Current Probe | 30A measurement range, 1mA resolution |
Key consideration factors: 1. Measurement environment (voltage level, temperature, EMI conditions) 2. Equipment interface compatibility (connector types, probe spacing) 3. Safety certification (IEC 61010, CE, UL ratings) 4. Mechanical durability (bend radius, vibration resistance) 5. Calibration requirements (traceable NIST/ISO standards)
Current development directions: - Integration of smart identification (RFID-enabled leads) - Miniaturization for high-density PCB testing - Enhanced safety features (self-diagnostic insulation monitoring) - Wireless test lead systems for hazardous environments - Modular kits with tool-less probe exchange mechanisms