| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
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FLIR Extech |
FORCE GAUGE EXT. ROD, HOOK, 3 AD |
0 |
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FLIR Extech |
TACHOMETER, COMBINATION PHOTO/CO |
0 |
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FLIR Extech |
TACHOMETER COUNTER WITH NIST, 46 |
0 |
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FLIR Extech |
COLOR WAVEFORM ULTRASONIC THICKN |
0 |
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FLIR Extech |
POWER QUALITY METER W/ 3000A FLE |
0 |
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FLIR Extech |
TACHOMETER, CONTACT |
0 |
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FLIR Extech |
CALIBRATOR W/ NIST 412355A |
0 |
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FLIR Extech |
TACHOMETER WITH NIST 461995 |
0 |
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FLIR Extech |
ULTRASONIC THICKNESS GAUGE/DATAL |
0 |
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FLIR Extech |
CALIBRATOR WITH NIST, 421400 |
0 |
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FLIR Extech |
CAPACITANCE SUBSTITUTION BOX |
0 |
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FLIR Extech |
4-WIRE EARTH GROUND RESISTANCE T |
0 |
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FLIR Extech |
FERROUS AND NON-FERROUS COATING |
0 |
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FLIR Extech |
TACHOMETER W/NIST 461891 |
0 |
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FLIR Extech |
MULTIFUNCTION CALIBRATOR WITH NI |
0 |
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FLIR Extech |
POWER QUALITY METER W/ 1200A FLE |
0 |
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FLIR Extech |
4-WIRE EARTH GROUND RESISTANCE/R |
0 |
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FLIR Extech |
MILLIOHM METER W/NIST 380460 |
0 |
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FLIR Extech |
MICROPROCESSOR CALIBRATOR/THERMO |
0 |
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FLIR Extech |
MEGOHMMETER WITH NIST 380260 |
0 |
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Specialty Test and Measurement Equipment refers to high-precision instruments designed for specific measurement tasks that standard equipment cannot address. These devices are critical in R&D, quality control, and failure analysis across industries. Their importance stems from enabling accurate data acquisition in complex scenarios, such as high-frequency signals, extreme environmental conditions, or nanoscale physical parameters.
| Type | Functional Characteristics | Application Examples |
|---|---|---|
| Parametric Analyzers | High-resolution electrical parameter measurement (e.g., leakage current, capacitance) | Semiconductor device characterization |
| Vector Network Analyzers (VNA) | Frequency domain analysis of complex impedance and S-parameters | RF/microwave circuit design validation |
| Thermal Imaging Cameras | Non-contact temperature distribution measurement with IR sensors | Power electronics thermal management |
| Signal Integrity Analyzers | High-speed digital signal analysis with time-domain reflectometry | PCB trace impedance testing |
| Material Testing Machines | Mechanical property measurement under controlled stress/strain | Aerospace composite material evaluation |
Typical architectures include: - Sensor/transducer array with application-specific probes - Signal conditioning circuitry (amplifiers, filters) - High-speed ADC/DAC modules - FPGA-based processing units - Embedded display or interface ports (USB-C, HDMI, GPIB) - Environmental shielding (EMI/RFI protection enclosures) - Calibration hardware/software modules
| Parameter | Description | Importance |
|---|---|---|
| Measurement Accuracy | Deviation from true value (e.g., 0.05%) | Ensures reliable data for critical decisions |
| Frequency Range | Operational bandwidth (e.g., DC-67 GHz) | Determines applicable use cases |
| Sampling Rate | Data acquisition speed (e.g., 256 GS/s) | Captures high-speed transient events |
| Resolution | Smallest detectable change (e.g., 16-bit) | Enables precision in low-signal environments |
| Dynamic Range | Signal amplitude measurement span (e.g., 120 dB) | Handles wide-ranging signal strengths |
Primary industries include: - Semiconductor manufacturing (wafer-level testing) - Telecommunications (5G base station validation) - Automotive (EV battery performance analysis) - Aerospace (avionics signal integrity) - Medical devices (implantable sensor calibration) - Academic research (nanotechnology experiments)
| Manufacturer | Representative Product | Key Specifications |
|---|---|---|
| Keysight Technologies | N1062A PXIe Oscilloscope | 63 Gbps sampling rate, 8 channels |
| Teledyne LeCroy | WaveMaster 8Zi-B | 40 GHz bandwidth, 100 GS/s |
| Rohde & Schwarz | ZNBT20 VNA | 9 kHz-20 GHz, 16-port configuration |
| Fluke Calibration | 729 Pressure Controller | 0.008% accuracy, 9 MPa range |
| KLA Instruments | K-Alpha+ XPS | 10 nm spatial resolution, 0.1 eV energy resolution |
Key considerations: 1. Match measurement range/sensitivity to application needs 2. Verify compliance with industry standards (e.g., IEEE 1651 for VNAs) 3. Evaluate software ecosystem (API support, automation capabilities) 4. Consider environmental requirements (temperature stability, vibration resistance) 5. Total cost of ownership (calibration frequency, probe replacement costs) 6. Future-proofing (modular architecture, upgrade paths)
Current trends shaping the sector: - Integration of AI/ML for predictive maintenance and anomaly detection - Miniaturization through MEMS sensor technology (e.g., handheld VNAs) - Increased adoption of O-RAN architecture driving new wireless test requirements - Quantum measurement systems entering commercial markets - Cloud-connected instruments enabling remote monitoring and data analytics - Enhanced EMI/EMC testing solutions for autonomous vehicle development
Application Case: In 5G mmWave testing, Keysight's UXM 5G Wireless Test Set combines parametric and protocol testing in a single platform, reducing validation time by 40% compared to traditional methods.