| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
EMIT |
COMBO TESTER X3, TESTER ONLY |
0 |
|
 |
EMIT |
ANLG SRFC RESIS METER |
0 |
|
 |
EMIT |
CHARGED PLATE ANALYZER, 6''X6'', |
0 |
|
 |
EMIT |
ZERO VLT MNTR W/WRST STP KT 120V |
7 |
|
 |
EMIT |
BODY VOLTAGE METER |
11 |
|
 |
EMIT |
IONIZATION TEST KIT |
2 |
|
 |
EMIT |
WRISTSTRAP TESTER 9V OPERATION |
99 |
|
 |
EMIT |
DIGITAL SURFACE RESIST METER KIT |
52 |
|
 |
EMIT |
MONITOR DUAL WIRE CONTINOUS 120V |
31 |
|
 |
EMIT |
TESTER COMBO WS & FG NIST |
4 |
|
 |
EMIT |
TESTER W/S 2 ST TOUCH W/220V |
0 |
|
 |
EMIT |
VERIFICATION TESTER WAVE DISTORT |
31 |
|
 |
EMIT |
SURFACE RESISTANCE CHECKER |
9 |
|
 |
EMIT |
MONITOR UNIVERSAL PWR ADAPTER |
1816 |
|
 |
EMIT |
MNTR GND GRD 4.5 W/BZZR-SW 120VA |
8 |
|
 |
EMIT |
LIMIT COMPARATOR, FOR DUAL WIRE |
9 |
|
 |
EMIT |
CALIBRATION UNIT NIST STD WS&FG |
322 |
|
 |
EMIT |
COMBO TESTER X3/STAND |
1022 |
|
 |
EMIT |
TSTR AC OTLT-WRST STRP 120VAC |
1613 |
|
 |
EMIT |
TESTER CALIBRATION |
0 |
|
Static control, electrostatic discharge (ESD) protection, and clean room monitoring/test equipment are critical for maintaining product integrity in precision manufacturing environments. These devices ensure compliance with international standards (e.g., ISO 14644-1, ANSI/ESD S20.20) by quantifying electrostatic fields, particle contamination, and environmental parameters. Their importance spans semiconductor fabrication, pharmaceutical production, aerospace engineering, and nanotechnology applications.
| Type | Functional Features | Application Examples |
|---|---|---|
| Electrostatic Field Meters | Measures electric field strength ( 1 kV/m to 100 kV/m), polarity detection | Wafer handling areas in semiconductor plants |
| Laser Particle Counters | Counts particles 0.1 m, real-time data logging | ISO Class 3 clean rooms for photolithography |
| Surface Resistance Testers | Measures resistance (10^3-10^18 ), non-contact operation | ESD mat validation in electronics assembly lines |
| Personnel Grounding Monitors | Tests wrist strap/footwear continuity, 5% accuracy | Pharmaceutical clean rooms with GMP compliance |
Typical systems integrate: (1) Sensor arrays (capacitive, laser diodes, or conductive probes), (2) Signal processing units with 24-bit ADCs, (3) HMI interfaces (LCD/touchscreens), (4) Communication modules (RS-485, Ethernet/IP67). Advanced models feature HEPA-filtered air sampling systems and AI-driven anomaly detection algorithms.
| Parameter | Typical Range/Value | Importance |
|---|---|---|
| Measurement Accuracy | 1-5% of reading | Determines compliance with specifications |
| Response Time | 50 ms - 5 sec | Enables real-time process adjustments |
| Particle Size Range | 0.01-10 m | Defines contamination control capability |
| Operating Temperature | 0-50 C | Affects measurement stability |
Key industries include: - Semiconductor manufacturing (photolithography tool monitoring) - Biopharmaceuticals (Grade A/B room certification) - Aerospace (fuel system component assembly) - Data centers (server rack ESD protection) - Medical device production (Class 8 clean rooms)
| Vendor | Representative Product | Key Features |
|---|---|---|
| Keysight Technologies | U1282A ESD Analyzer | Real-time spectral analysis, 0.1 fF resolution |
| Lighthouse Worldwide | LASAIR III Particle Counter | 1 CFM flow rate, 0.1 m sensitivity |
| Sanyo Denki | San-Ei LP-312 ESD Monitor | Dual-axis field detection, USB interface |
Consider: (1) Measurement range vs. process requirements, (2) Calibration traceability to NIST standards, (3) Environmental compatibility (humidity/temperature ranges), (4) Integration with SCADA systems, (5) Lifecycle maintenance costs. For clean rooms, verify compliance with ISO 14644-1 classification requirements.
Emerging developments include: - IoT-enabled predictive maintenance systems - MEMS-based miniaturized particle sensors - AI-powered contamination source tracking - Increased demand for sub-10 nm particle detection in quantum computing facilities - Hybrid ESD/cleanliness monitoring platforms with digital twin integration