Monitors, Testers

Image Part Number Description / PDF Quantity Rfq
CTC034-030-3-WW

CTC034-030-3-WW

SCS

EM AWARE MONITOR EVENT ONLY 4.20

0

94373

94373

EMIT

VERIFICATION TESTER, FOR GROUND

0

ACL 450

ACL 450

ACL Staticide, Inc.

LOCATOR ELECTROSTATIC IONIZED

0

94391

94391

EMIT

MNTR GND GRD 5 W/BZZR-SW GND

0

CTC062-5-243-WW

CTC062-5-243-WW

SCS

WS AWARE MON MODBUS OUT BIG BROT

0

CTC034-031-5-WW

CTC034-031-5-WW

SCS

EM AWARE MONITOR EVENT FIELD & I

0

770004

770004

SCS

CHARGED PLATE ANALYZER NA

0

94393

94393

EMIT

MNTR GND GRD 5 W/BZZR-SW 120VAC

0

770061

770061

SCS

WS AWARE MONITOR STANDARD REMOTE

5

SPI-20686

SPI-20686

EMIT

MONITOR CUSTOM OVERLAY/WS

1

94335

94335

EMIT

TESTER CALIB FORGROUND GARD 4.5

0

770033

770033

SCS

CALIBRATION UNIT FOR COMBO TESTE

0

19247

19247

EMIT

MONITOR DUAL OPERATOR 220V

0

CTC061-5-242-WW

CTC061-5-242-WW

SCS

WS AWARE MONITOR MODBUS OUT STAN

0

CTC061-RT-242-T

CTC061-RT-242-T

SCS

WS AWARE MONITOR RELAY OUT STAND

0

62170

62170

EMIT

LIMIT COMPARATOR DUALWIRE MONITO

0

CTC062-3-242-T

CTC062-3-242-T

SCS

WS AWARE MONITOR 4.20MA OUT STAN

0

ACL 800C

ACL 800C

ACL Staticide, Inc.

DIGITAL MEGOHMMETER (CELSIUS)

2

770005

770005

SCS

CHARGED PLATE ANALYZER NO PWR CR

0

94390

94390

EMIT

MNTR GND GRD 4.5 W/BZZR-SW GND

11

Monitors, Testers

1. Overview

Static control, electrostatic discharge (ESD) protection, and clean room monitoring/test equipment are critical for maintaining product integrity in precision manufacturing environments. These devices ensure compliance with international standards (e.g., ISO 14644-1, ANSI/ESD S20.20) by quantifying electrostatic fields, particle contamination, and environmental parameters. Their importance spans semiconductor fabrication, pharmaceutical production, aerospace engineering, and nanotechnology applications.

2. Major Types & Functional Classification

TypeFunctional FeaturesApplication Examples
Electrostatic Field MetersMeasures electric field strength ( 1 kV/m to 100 kV/m), polarity detectionWafer handling areas in semiconductor plants
Laser Particle CountersCounts particles 0.1 m, real-time data loggingISO Class 3 clean rooms for photolithography
Surface Resistance TestersMeasures resistance (10^3-10^18 ), non-contact operationESD mat validation in electronics assembly lines
Personnel Grounding MonitorsTests wrist strap/footwear continuity, 5% accuracyPharmaceutical clean rooms with GMP compliance

3. Structural & Technical Composition

Typical systems integrate: (1) Sensor arrays (capacitive, laser diodes, or conductive probes), (2) Signal processing units with 24-bit ADCs, (3) HMI interfaces (LCD/touchscreens), (4) Communication modules (RS-485, Ethernet/IP67). Advanced models feature HEPA-filtered air sampling systems and AI-driven anomaly detection algorithms.

4. Key Technical Parameters

ParameterTypical Range/ValueImportance
Measurement Accuracy 1-5% of readingDetermines compliance with specifications
Response Time50 ms - 5 secEnables real-time process adjustments
Particle Size Range0.01-10 mDefines contamination control capability
Operating Temperature0-50 CAffects measurement stability

5. Application Fields

Key industries include: - Semiconductor manufacturing (photolithography tool monitoring) - Biopharmaceuticals (Grade A/B room certification) - Aerospace (fuel system component assembly) - Data centers (server rack ESD protection) - Medical device production (Class 8 clean rooms)

6. Leading Manufacturers & Products

VendorRepresentative ProductKey Features
Keysight TechnologiesU1282A ESD AnalyzerReal-time spectral analysis, 0.1 fF resolution
Lighthouse WorldwideLASAIR III Particle Counter1 CFM flow rate, 0.1 m sensitivity
Sanyo DenkiSan-Ei LP-312 ESD MonitorDual-axis field detection, USB interface

7. Selection Guidelines

Consider: (1) Measurement range vs. process requirements, (2) Calibration traceability to NIST standards, (3) Environmental compatibility (humidity/temperature ranges), (4) Integration with SCADA systems, (5) Lifecycle maintenance costs. For clean rooms, verify compliance with ISO 14644-1 classification requirements.

8. Industry Trends

Emerging developments include: - IoT-enabled predictive maintenance systems - MEMS-based miniaturized particle sensors - AI-powered contamination source tracking - Increased demand for sub-10 nm particle detection in quantum computing facilities - Hybrid ESD/cleanliness monitoring platforms with digital twin integration

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