Monitors, Testers

Image Part Number Description / PDF Quantity Rfq
19223

19223

EMIT

MONITOR CONTINUOUS WORKSTATION

0

19445

19445

EMIT

METER STATIC FIELD DIG CHPD

0

19326

19326

EMIT

FULL-TIME CONTINUOUS MONITOR, 22

0

19277

19277

EMIT

TESTER COMBO X3 WITH STAND

0

ACL400

ACL400

ACL Staticide, Inc.

LOCATOR ELECTROSTATIC IONIZED

0

3M2A3-C-TNG

3M2A3-C-TNG

SCS

EM AWARE TNG ESD MON STARTER KIT

0

19210

19210

EMIT

MONITOR WRISTSTRAP/WRKSTN 120V

0

724K-WM10

724K-WM10

SCS

MNTRNG KIT 724 PLUS WS W/GRY MAT

0

3M2A1-C-TNG

3M2A1-C-TNG

SCS

EM AWARE TNG ESD MON STARTER KIT

0

ACL600

ACL600

ACL Staticide, Inc.

STATIC CHECKER W/GND CORD-CASE

0

3M2A5-C-TNG

3M2A5-C-TNG

SCS

EM AWARE START KIT

0

50515

50515

EMIT

MONITOR, PROGRAMMABLE, DUAL W/2

0

3M2A6-C-TNG

3M2A6-C-TNG

SCS

EM AWARE TNG ESD MON STARTER KIT

0

19229

19229

EMIT

MNTR MLT-MNT 120VAC W/WRST STRP

0

WSMONITOR3-230VAC

WSMONITOR3-230VAC

SCS

MONITOR WRIST STRAP

0

19222

19222

EMIT

MONITOR CONTINUOUS WORKSTATION

0

94370

94370

EMIT

TESTER CALIBRATION

0

50522

50522

EMIT

DL OP CONT MNTR W/WRST STP 120V

0

50537

50537

EMIT

MONITOR, ZERO VOLT, WITH 2 WRIST

0

62101

62101

EMIT

COMBO TESTER X3 120VAC

0

Monitors, Testers

1. Overview

Static control, electrostatic discharge (ESD) protection, and clean room monitoring/test equipment are critical for maintaining product integrity in precision manufacturing environments. These devices ensure compliance with international standards (e.g., ISO 14644-1, ANSI/ESD S20.20) by quantifying electrostatic fields, particle contamination, and environmental parameters. Their importance spans semiconductor fabrication, pharmaceutical production, aerospace engineering, and nanotechnology applications.

2. Major Types & Functional Classification

TypeFunctional FeaturesApplication Examples
Electrostatic Field MetersMeasures electric field strength ( 1 kV/m to 100 kV/m), polarity detectionWafer handling areas in semiconductor plants
Laser Particle CountersCounts particles 0.1 m, real-time data loggingISO Class 3 clean rooms for photolithography
Surface Resistance TestersMeasures resistance (10^3-10^18 ), non-contact operationESD mat validation in electronics assembly lines
Personnel Grounding MonitorsTests wrist strap/footwear continuity, 5% accuracyPharmaceutical clean rooms with GMP compliance

3. Structural & Technical Composition

Typical systems integrate: (1) Sensor arrays (capacitive, laser diodes, or conductive probes), (2) Signal processing units with 24-bit ADCs, (3) HMI interfaces (LCD/touchscreens), (4) Communication modules (RS-485, Ethernet/IP67). Advanced models feature HEPA-filtered air sampling systems and AI-driven anomaly detection algorithms.

4. Key Technical Parameters

ParameterTypical Range/ValueImportance
Measurement Accuracy 1-5% of readingDetermines compliance with specifications
Response Time50 ms - 5 secEnables real-time process adjustments
Particle Size Range0.01-10 mDefines contamination control capability
Operating Temperature0-50 CAffects measurement stability

5. Application Fields

Key industries include: - Semiconductor manufacturing (photolithography tool monitoring) - Biopharmaceuticals (Grade A/B room certification) - Aerospace (fuel system component assembly) - Data centers (server rack ESD protection) - Medical device production (Class 8 clean rooms)

6. Leading Manufacturers & Products

VendorRepresentative ProductKey Features
Keysight TechnologiesU1282A ESD AnalyzerReal-time spectral analysis, 0.1 fF resolution
Lighthouse WorldwideLASAIR III Particle Counter1 CFM flow rate, 0.1 m sensitivity
Sanyo DenkiSan-Ei LP-312 ESD MonitorDual-axis field detection, USB interface

7. Selection Guidelines

Consider: (1) Measurement range vs. process requirements, (2) Calibration traceability to NIST standards, (3) Environmental compatibility (humidity/temperature ranges), (4) Integration with SCADA systems, (5) Lifecycle maintenance costs. For clean rooms, verify compliance with ISO 14644-1 classification requirements.

8. Industry Trends

Emerging developments include: - IoT-enabled predictive maintenance systems - MEMS-based miniaturized particle sensors - AI-powered contamination source tracking - Increased demand for sub-10 nm particle detection in quantum computing facilities - Hybrid ESD/cleanliness monitoring platforms with digital twin integration

RFQ BOM Call Skype Email
Top