Video Inspection Systems

Image Part Number Description / PDF Quantity Rfq
26700-102-15

26700-102-15

Aven

VIDEO INS SYS USB 1.4MP 21X-133X

0

26700-401-556

26700-401-556

Aven

MICROSCOPE ULTRA-GLIDE ARM STAND

0

26700-103-10

26700-103-10

Aven

VIDEO INSP SYST CMOS 3.7X-61.9X

2

26700-102-35

26700-102-35

Aven

VIDEO INSPECT SYST CMOS 39X-263X

0

26100-257SD

26100-257SD

Aven

VIDEO INSPECTION SYSTEM CMOS

6

26700-102-10

26700-102-10

Aven

VIDEO INSPECT SYST CMOS 21X-133X

1

26700-133DBS

26700-133DBS

Aven

VIDEO INSPECT SYST CMOS 4.7X-29X

0

26700-133

26700-133

Aven

VIDEO INSPECT SYST CMOS 4.7X-29X

0

26700-134

26700-134

Aven

VIDEO INSPECT SYST CMOS 19X-128X

0

26800B-385STA

26800B-385STA

Aven

VIDEO INSP SYST CMOS 3.25X-22.5X

0

26800B-385DBS

26800B-385DBS

Aven

VIDEO INSP SYST CMOS 3.25X-22.5X

0

26700-106-14

26700-106-14

Aven

VID INSP SYST USB 1.4MP 50X-300X

0

26700-134STA

26700-134STA

Aven

VIDEO INSPECT SYST CMOS 19X-128X

0

26700-134DBS

26700-134DBS

Aven

VIDEO INSPECT SYST CMOS 19X-128X

0

26700-121

26700-121

Aven

VIDEO INSPECT SYST CMOS 3X-80X

0

26700-120

26700-120

Aven

VIDEO INSPECT SYST CMOS 3X-80X

0

26700-106-10

26700-106-10

Aven

VIDEO INSPECT SYST CCD 50X-300X

0

26700-106-20

26700-106-20

Aven

VID INSP SYST USB 2.0MP 50X-300X

0

Video Inspection Systems

1. Overview

Video Inspection Systems (VIS) are advanced optical measurement and defect detection solutions that combine machine vision technology with precision optics. These systems enable non-contact, high-speed, and high-accuracy inspection of components and materials across various industries. Modern VIS integrates AI-driven image processing algorithms, multi-spectral imaging, and automated analysis to ensure product quality, safety, and compliance with manufacturing standards.

2. Major Types and Functional Classification

TypeFunctional FeaturesApplication Examples
2D Vision SystemsHigh-resolution planar imaging with dimensional measurement capabilitiesPCB solder paste inspection
3D Profiling SystemsLaser triangulation for surface topography analysisWeld seam quality control
Multi-spectral SystemsSimultaneous visible/NIR/SWIR wavelength captureFood contamination detection
High-speed Imaging1000+ fps capture with motion compensation algorithmsAutomotive component sorting
Thermal Vision SystemsNon-contact temperature distribution analysisElectrical system thermal mapping

3. Structure and Components

Typical VIS configurations include:

  • Optical subsystem: 4K CMOS/CCD sensors with variable magnification lenses
  • Illumination module: Programmable LED arrays (400-1000nm range)
  • Motion control: Precision XYZ stages with sub-micron positioning accuracy
  • Processing unit: Embedded GPUs for real-time image analysis
  • Software suite: Custom algorithms for defect classification and SPC reporting
  • Environmental controls: Temperature-stabilized enclosures for metrology-grade accuracy

4. Key Technical Parameters

ParameterTypical RangeSignificance
Resolution0.1-10 m/pixelDetermines minimum detectable defect size
Frame Rate50-5000 fpsImpacts throughput in high-speed production
Depth of Field0.5-50mmCritical for 3D feature inspection
Dynamic Range60-120dBAffects contrast sensitivity for subtle defects
Color Accuracy E < 1.5Essential for surface finish evaluation
MTBF>50,000 hoursSystem reliability indicator

5. Application Fields

Key industry applications:

  • Semiconductor manufacturing: Wafer defect detection systems
  • Automotive: Cylinder bore surface analysis equipment
  • Pharmaceuticals: Tablet coating integrity checkers
  • Consumer electronics: Display micro-crack inspection machines
  • Aerospace: Turbine blade thermal barrier coating assessment

6. Leading Manufacturers and Products

ManufacturerProduct SeriesKey Specifications
CognexDSMax 3D5 m resolution, 2000 fps, blue laser illumination
KeyenceVR-310020MP color sensor, 3 repeatability 1 m
BaumerVisionLine FL80dB dynamic range, IP67 rating
NordsonLumenCheckSpectral analysis from 380-780nm
ISRA VisionSurfaceViewWeb inspection up to 10m/s speed

7. Selection Recommendations

Key selection criteria:

  • Match resolution requirements with sensor pixel size and optics capability
  • Ensure illumination system covers target material spectral characteristics
  • Validate environmental compatibility (temperature, vibration, dust)
  • Evaluate software features for specific defect classification needs
  • Calculate ROI considering inspection speed vs. production line throughput

Case Study: In lithium battery electrode inspection, selection of 1.5 m resolution system reduced defect escape rate from 200 PPM to 8 PPM.

8. Industry Trends

Emerging development directions:

  • Integration of deep learning for adaptive defect recognition
  • Quantum dot sensors enabling hyperspectral imaging at video rates
  • Miniaturization through embedded vision system-on-chip (VSoC) technology
  • Cloud-connected systems enabling predictive maintenance and AI training
  • Multi-modal fusion systems combining optical, thermal, and acoustic data

Market projections indicate 12.3% CAGR through 2028, driven by EV battery and advanced packaging inspection demands.

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