Accessories

Image Part Number Description / PDF Quantity Rfq
26501-LED-PWS

26501-LED-PWS

Aven

POWER SUPPLY FOR 501 SERIES LED

217

26800B-534-EP

26800B-534-EP

Aven

10 INCH EXTENSION POST FOR DOUBL

42

26700-400-PWS

26700-400-PWS

Aven

POWER SUPPLY FOR CYCLOPS DIGITAL

27

26501-DSG-CL

26501-DSG-CL

Aven

REPLACEMENT CLAMP FOR DSG SERIES

280

26200B-221-GNUV

26200B-221-GNUV

Aven

REPLACEMENT GOOSENECK FOR 26200B

265

26800B-600

26800B-600

Aven

BOOM STAND MOUNTING POST FOR INS

23

26505-LED-PWS

26505-LED-PWS

Aven

POWER SUPPLY FOR 505 MAGNIFYING

216

26700-180AP

26700-180AP

Aven

ADAPTER PLATE FOR ZOOM 7000 MACR

227

26527-MB

26527-MB

Aven

SIRRUS 26527 MAGNETIC BASE

12

26003

26003

Aven

RETICLE SCALE NO.1

4

26800B-485

26800B-485

Aven

OBLIQUE VIEWER

1

26503-B32

26503-B32

Aven

BULB REPLACEMENT 32W

0

26800B-430

26800B-430

Aven

ADAPTER PLATE FOR MACRO LENS

0

26100-255-RC

26100-255-RC

Aven

REMOTE CONTROL CAMERA 720P

4

26501-B22

26501-B22

Aven

BULB REPLACEMENT 22W

0

26700-403

26700-403

Aven

MONITOR LCD

1

26100-255-PWR

26100-255-PWR

Aven

POWER SUPPLY CAMERA 720P

3

26004

26004

Aven

RETICLE SCALE NO.2

0

26505-RC

26505-RC

Aven

REPLACEMENT CLAMP FOR 26505 SRS

0

26800B-471

26800B-471

Aven

GLIDING STAGE 114MM X 114MM

0

Accessories

1. Overview

Optical inspection equipment accessories are modular components that enhance the functionality, precision, and adaptability of optical inspection systems. These accessories include illumination sources, lenses, sensors, filters, and software modules. They play a critical role in industrial quality control, semiconductor manufacturing, biomedical imaging, and precision measurement by enabling accurate defect detection, dimensional analysis, and material characterization.

2. Major Types and Functional Classification

TypeFunctional CharacteristicsApplication Examples
High-Intensity LED LightingUniform illumination, adjustable wavelength, low thermal emissionSurface defect detection in PCB manufacturing
Telecentric LensesMinimize perspective errors, maintain constant magnificationPrecision metrology in semiconductor wafer inspection
Hyperspectral Imaging SensorsCapture spectral and spatial data simultaneouslyMaterial analysis in food quality control
Optical FiltersSelective wavelength transmission/reflectionFluorescence imaging in biomedical diagnostics
Motorized XY StagesHigh-precision positioning with sub-micron resolutionAutomated sample scanning in R&D laboratories

3. Structural and Technical Composition

A typical accessory system consists of:
- Mechanical housing with vibration-damping mounts
- Optical components (lenses, prisms, diffraction gratings)
- Electronic control units with interface ports (USB 3.0, GigE Vision)
- Calibration modules for environmental compensation
- Software development kits (SDKs) for system integration

4. Key Technical Specifications

ParameterDescriptionImportance
ResolutionMinimum detectable feature size (1-10 m range)Determines defect detection capability
Wavelength RangeOperational spectral band (UV-VIS-NIR: 200-2500 nm)Material interaction specificity
Working DistanceOptimal object-to-lens distance (10-200 mm)System design flexibility
Data Transfer RateUp to 10 Gbps via CoaXPress interfacesReal-time inspection throughput
Environmental ToleranceOperating temperature (0-50 C), humidity resistanceSystem reliability in industrial settings

5. Application Fields

  • Semiconductor manufacturing (wafer defect inspection)
  • Electronics assembly (AOI systems for solder joint analysis)
  • Medical diagnostics (digital pathology scanners)
  • Automotive industry (surface finish measurement)
  • Pharmaceutical packaging (print quality verification)

6. Leading Manufacturers and Representative Products

ManufacturerProduct SeriesKey Specifications
KeyenceCV-X4 Series ControllersMulti-sensor fusion, 0.1 m resolution
CognexDVT Summit SeriesEmbedded vision systems with AI algorithms
OlympusStream Essentials Software3D surface analysis for metallurgy
CCS OptoLDR2-50SW2 LightingStrobe synchronization at 50,000 lx output

7. Selection Recommendations

Key considerations include:
- Matching numerical aperture (NA) with required depth of field
- Spectral compatibility between light sources and sensors
- Environmental sealing (IP ratings for dusty/humid environments)
- Software API compatibility with existing automation systems
- Calibration certification (NIST traceability preferred)

8. Industry Trends Analysis

Current development trends include:
- Integration of AI-powered defect classification algorithms
- Miniaturization through MEMS-based optical components
- Multi-spectral imaging combining visible and thermal IR bands
- Standardization of plug-and-play interfaces (USB4 Vision, XCP)

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