| Image | Part Number | Description / PDF | Quantity | Rfq |
|---|---|---|---|---|
 |
Dunwell Tech, Inc. |
WIFI MODULE: CHECK COMPATIBILITY |
7 |
|
 |
Excelitas Technologies |
X-Cite adaptor |
1 |
|
 |
Excelitas Technologies |
LED RING LIGHT ADAPTER |
1 |
|
 |
Excelitas Technologies |
COAX ILLUM MODULE W/ 30MM WD |
4 |
|
 |
Excelitas Technologies |
CAMERA TUBE,.5X 100FL |
0 |
|
 |
Excelitas Technologies |
FIXED TUBE MINI, 450 |
2 |
|
 |
Excelitas Technologies |
INTL FOCUS MODULE W/130MM WD |
1 |
|
 |
Excelitas Technologies |
12.5X ZOOM STEPPER |
0 |
|
 |
Excelitas Technologies |
CAMERA TUBE,.4X 80FL |
6 |
|
 |
Excelitas Technologies |
7:1 ZOOM MANUAL |
5 |
|
 |
Dunwell Tech, Inc. |
LED BACKLIGHT |
10 |
|
 |
Excelitas Technologies |
MICRO 4/3 CAMERA MOUNT |
1 |
|
 |
Excelitas Technologies |
60 FLEXIBLE FIBER OPTIC |
2 |
|
 |
Aven |
AUXILIARY LENS COVER |
15 |
|
 |
Excelitas Technologies |
EOS CAMERA MOUNT |
1 |
|
 |
Aven |
IMAGE CAPTURE BOX HDMI |
2 |
|
 |
REED Instruments |
3.9MM CAMERA HEAD |
2 |
|
 |
Aven |
REPLACEMENT BULB 22-WATT FOR 265 |
323 |
|
 |
REED Instruments |
9MM CAMERA HEAD ON 16.4' (5M) CA |
2 |
|
 |
Excelitas Technologies |
7:1 ZOOM STEPPER MOTORIZED |
0 |
|
Optical inspection equipment accessories are modular components that enhance the functionality, precision, and adaptability of optical inspection systems. These accessories include illumination sources, lenses, sensors, filters, and software modules. They play a critical role in industrial quality control, semiconductor manufacturing, biomedical imaging, and precision measurement by enabling accurate defect detection, dimensional analysis, and material characterization.
| Type | Functional Characteristics | Application Examples |
|---|---|---|
| High-Intensity LED Lighting | Uniform illumination, adjustable wavelength, low thermal emission | Surface defect detection in PCB manufacturing |
| Telecentric Lenses | Minimize perspective errors, maintain constant magnification | Precision metrology in semiconductor wafer inspection |
| Hyperspectral Imaging Sensors | Capture spectral and spatial data simultaneously | Material analysis in food quality control |
| Optical Filters | Selective wavelength transmission/reflection | Fluorescence imaging in biomedical diagnostics |
| Motorized XY Stages | High-precision positioning with sub-micron resolution | Automated sample scanning in R&D laboratories |
A typical accessory system consists of:
- Mechanical housing with vibration-damping mounts
- Optical components (lenses, prisms, diffraction gratings)
- Electronic control units with interface ports (USB 3.0, GigE Vision)
- Calibration modules for environmental compensation
- Software development kits (SDKs) for system integration
| Parameter | Description | Importance |
|---|---|---|
| Resolution | Minimum detectable feature size (1-10 m range) | Determines defect detection capability |
| Wavelength Range | Operational spectral band (UV-VIS-NIR: 200-2500 nm) | Material interaction specificity |
| Working Distance | Optimal object-to-lens distance (10-200 mm) | System design flexibility |
| Data Transfer Rate | Up to 10 Gbps via CoaXPress interfaces | Real-time inspection throughput |
| Environmental Tolerance | Operating temperature (0-50 C), humidity resistance | System reliability in industrial settings |
| Manufacturer | Product Series | Key Specifications |
|---|---|---|
| Keyence | CV-X4 Series Controllers | Multi-sensor fusion, 0.1 m resolution |
| Cognex | DVT Summit Series | Embedded vision systems with AI algorithms |
| Olympus | Stream Essentials Software | 3D surface analysis for metallurgy |
| CCS Opto | LDR2-50SW2 Lighting | Strobe synchronization at 50,000 lx output |
Key considerations include:
- Matching numerical aperture (NA) with required depth of field
- Spectral compatibility between light sources and sensors
- Environmental sealing (IP ratings for dusty/humid environments)
- Software API compatibility with existing automation systems
- Calibration certification (NIST traceability preferred)
Current development trends include:
- Integration of AI-powered defect classification algorithms
- Miniaturization through MEMS-based optical components
- Multi-spectral imaging combining visible and thermal IR bands
- Standardization of plug-and-play interfaces (USB4 Vision, XCP)