| Manufacturer Part | SN74BCT8374ANTG4 |
|---|---|
| Manufacturer | Texas Instruments |
| Description | IC SCAN TEST DEVICE W/FF 24-DIP |
| Category | Integrated Circuits Supplier | Global Semiconductor Distributor |
| RoHS | Lead free / RoHS Compliant |
| Warranty | 365 days |
| Availability | 0 pieces |
| Shipped from | HK warehouse |
| Expected Shipping | Dec 09 - Dec 13 2025 |
In Stock Min.: 1 Mult.: 1
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| Type | Description |
|---|---|
| Series: | 74BCT |
| Package: | Tube |
| Part Status: | Obsolete |
| Logic Type: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage: | 4.5V ~ 5.5V |
| Number of Bits: | 8 |
| Operating Temperature: | 0°C ~ 70°C |
| Mounting Type: | Through Hole |
| Package / Case: | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package: | 24-PDIP |
| Payment method | Hand Fee |
| Telegraphic Transfer | Request service |
| Paypal | 4% fee |
| Credit Card | 4% fee |
| Western Union | Free of charge |
| Money Gram | Free of charge |
| Shipping Type | Lead Time |
| DHL | 2-5 days |
| Fedex | 2-5 days |
| UPS | 2-5 days |
| TNT | 2-6 days |
| EMS | 3-7 days |
| Registered Air Mail | 20-35 days |
ICL 7 OHM 20% 15A 31MM
RF FET LDMOS 65V 20DB SOT1239B
VMI PIN YOKE SUPPORT
XTAL OSC TCXO 32.7680KHZ CMOS TH
IC VREF SHUNT 0.5% TO92-3
IC SCAN TEST DEVICE W/FF 24-DIP
SMART CARD
