| Manufacturer Part | SN74ABTH18646APM |
|---|---|
| Manufacturer | Texas Instruments |
| Description | IC SCAN-TEST-DEV/TXRX 64-LQFP |
| Category | Integrated Circuits Supplier | Global Semiconductor Distributor |
| RoHS | Lead free / RoHS Compliant |
| Warranty | 365 days |
| Availability | 160 pieces |
| Shipped from | HK warehouse |
| Expected Shipping | Dec 08 - Dec 12 2025 |
In Stock Min.: 1 Mult.: 1
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| Type | Description |
|---|---|
| Series: | 74ABTH |
| Package: | Tray |
| Part Status: | Active |
| Logic Type: | Scan Test Device With Transceivers And Registers |
| Supply Voltage: | 4.5V ~ 5.5V |
| Number of Bits: | 18 |
| Operating Temperature: | -40°C ~ 85°C |
| Mounting Type: | Surface Mount |
| Package / Case: | 64-LQFP |
| Supplier Device Package: | 64-LQFP (10x10) |
| Payment method | Hand Fee |
| Telegraphic Transfer | Request service |
| Paypal | 4% fee |
| Credit Card | 4% fee |
| Western Union | Free of charge |
| Money Gram | Free of charge |
| Shipping Type | Lead Time |
| DHL | 2-5 days |
| Fedex | 2-5 days |
| UPS | 2-5 days |
| TNT | 2-6 days |
| EMS | 3-7 days |
| Registered Air Mail | 20-35 days |
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