Accessories

Image Part Number Description / PDF Quantity Rfq
26700-400-PL01

26700-400-PL01

Aven

CYCLOPS OBJECTIVE LENS 4X WITH P

44

26800B-472

26800B-472

Aven

GLIDING STAGE 140MM X 114MM

0

26520-MB

26520-MB

Aven

MAGNETIC BASE

1118

26700-156

26700-156

Aven

COUPLR FOR VIDEO MICRO LENS 0.5X

6

26700-400-GN02

26700-400-GN02

Aven

CYCLOPS LASER POINTER

217

26800B-460

26800B-460

Aven

ADAPTER TO MOUNT RING LIGHTS

345

26700-400-L-4XLF

26700-400-L-4XLF

Aven

CYCLOPS 4X LONG FOCUS LENS

13

26501-RL8D

26501-RL8D

Aven

REPLACEMENT LENS 8D FOR PROVUE M

0

26100-256

26100-256

Aven

CONNECT ADAPT - WI-FI DIGITAL CA

21

26700-217

26700-217

Aven

POLARIZER FOR MIGHTY SCOPE 5M

83

26700-406

26700-406

Aven

LCD MONITOR LED 22" HDMI INPUT

1

26700-151AP

26700-151AP

Aven

ADAPTER PLATE FOR MICRO LENS 640

7

26800B-465

26800B-465

Aven

AUXILIARY LENS COVER

15

26700-401-ICB

26700-401-ICB

Aven

IMAGE CAPTURE BOX HDMI

2

26501-SIV-T5

26501-SIV-T5

Aven

REPLACEMENT BULB 22-WATT FOR 265

323

26200B-209DF2

26200B-209DF2

Aven

DIFFUSER FOR GLARE REDUCTION

44

26700-158

26700-158

Aven

COUPLER FOR VIDEO MICRO LENS 1X

3

26501-RL5D

26501-RL5D

Aven

REPLACEMENT LENS 5D FOR PROVUE M

6

26700-216

26700-216

Aven

POLARIZER FOR MIGHTY SCOPE 1.3M

7

26501-RL3D

26501-RL3D

Aven

REPLACEMENT LENS 3D FOR PROVUE M

536

Accessories

1. Overview

Optical inspection equipment accessories are modular components that enhance the functionality, precision, and adaptability of optical inspection systems. These accessories include illumination sources, lenses, sensors, filters, and software modules. They play a critical role in industrial quality control, semiconductor manufacturing, biomedical imaging, and precision measurement by enabling accurate defect detection, dimensional analysis, and material characterization.

2. Major Types and Functional Classification

TypeFunctional CharacteristicsApplication Examples
High-Intensity LED LightingUniform illumination, adjustable wavelength, low thermal emissionSurface defect detection in PCB manufacturing
Telecentric LensesMinimize perspective errors, maintain constant magnificationPrecision metrology in semiconductor wafer inspection
Hyperspectral Imaging SensorsCapture spectral and spatial data simultaneouslyMaterial analysis in food quality control
Optical FiltersSelective wavelength transmission/reflectionFluorescence imaging in biomedical diagnostics
Motorized XY StagesHigh-precision positioning with sub-micron resolutionAutomated sample scanning in R&D laboratories

3. Structural and Technical Composition

A typical accessory system consists of:
- Mechanical housing with vibration-damping mounts
- Optical components (lenses, prisms, diffraction gratings)
- Electronic control units with interface ports (USB 3.0, GigE Vision)
- Calibration modules for environmental compensation
- Software development kits (SDKs) for system integration

4. Key Technical Specifications

ParameterDescriptionImportance
ResolutionMinimum detectable feature size (1-10 m range)Determines defect detection capability
Wavelength RangeOperational spectral band (UV-VIS-NIR: 200-2500 nm)Material interaction specificity
Working DistanceOptimal object-to-lens distance (10-200 mm)System design flexibility
Data Transfer RateUp to 10 Gbps via CoaXPress interfacesReal-time inspection throughput
Environmental ToleranceOperating temperature (0-50 C), humidity resistanceSystem reliability in industrial settings

5. Application Fields

  • Semiconductor manufacturing (wafer defect inspection)
  • Electronics assembly (AOI systems for solder joint analysis)
  • Medical diagnostics (digital pathology scanners)
  • Automotive industry (surface finish measurement)
  • Pharmaceutical packaging (print quality verification)

6. Leading Manufacturers and Representative Products

ManufacturerProduct SeriesKey Specifications
KeyenceCV-X4 Series ControllersMulti-sensor fusion, 0.1 m resolution
CognexDVT Summit SeriesEmbedded vision systems with AI algorithms
OlympusStream Essentials Software3D surface analysis for metallurgy
CCS OptoLDR2-50SW2 LightingStrobe synchronization at 50,000 lx output

7. Selection Recommendations

Key considerations include:
- Matching numerical aperture (NA) with required depth of field
- Spectral compatibility between light sources and sensors
- Environmental sealing (IP ratings for dusty/humid environments)
- Software API compatibility with existing automation systems
- Calibration certification (NIST traceability preferred)

8. Industry Trends Analysis

Current development trends include:
- Integration of AI-powered defect classification algorithms
- Miniaturization through MEMS-based optical components
- Multi-spectral imaging combining visible and thermal IR bands
- Standardization of plug-and-play interfaces (USB4 Vision, XCP)

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