| Manufacturer Part | SN74BCT8373ADWRE4 |
|---|---|
| Manufacturer | Texas Instruments |
| Description | IC SCAN TEST DEVICE LATCH 24SOIC |
| Category | Integrated Circuits Supplier | Global Semiconductor Distributor |
| RoHS | Lead free / RoHS Compliant |
| Warranty | 365 days |
| Availability | 0 pieces |
| Shipped from | HK warehouse |
| Expected Shipping | Dec 08 - Dec 12 2025 |
In Stock Min.: 1 Mult.: 1
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| Type | Description |
|---|---|
| Series: | 74BCT |
| Package: | Tape & Reel (TR) |
| Part Status: | Obsolete |
| Logic Type: | Scan Test Device with D-Type Latches |
| Supply Voltage: | 4.5V ~ 5.5V |
| Number of Bits: | 8 |
| Operating Temperature: | 0°C ~ 70°C |
| Mounting Type: | Surface Mount |
| Package / Case: | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package: | 24-SOIC |
| Payment method | Hand Fee |
| Telegraphic Transfer | Request service |
| Paypal | 4% fee |
| Credit Card | 4% fee |
| Western Union | Free of charge |
| Money Gram | Free of charge |
| Shipping Type | Lead Time |
| DHL | 2-5 days |
| Fedex | 2-5 days |
| UPS | 2-5 days |
| TNT | 2-6 days |
| EMS | 3-7 days |
| Registered Air Mail | 20-35 days |
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IC SCAN TEST DEVICE LATCH 24SOIC
